We have observed
18 EP applications
has served for within the last five+ years.
(We consider all applications which have an EP A1 or A2 publication dated after September 25, 2013).
Please note, that we only count EP applications,
in which the name of the patent attorney is explicitly mentioned as representative.
These EP applications are:
Digital microscope and method for optimising the work process in a digital microscope
Control device and method for controlling a motorised digital microscope
Pivot arm stand for digital microscopes
Method for calibrating a digital optical device and optical device
Method for calibrating a digital optical imaging system, method for the correction of imaging defects in a digital optical imaging system, and digital optical imaging system
COMBINED CONFOCAL X-RAY FLUORESCENCE AND X-RAY COMPUTERISED TOMOGRAPHIC SYSTEM AND METHOD
DEVICE FOR MICROSCOPIC APPLICATIONS
LASER SCANNING MICROSCOPE AND METHOD FOR CORRECTING IMAGING ABERRATIONS MORE PARTICULARLY IN HIGH-RESOLUTION SCANNING MICROSCOPY
DIGITAL MICROSCOPE COMPRISING PIVOTING STAND, METHOD FOR CALIBRATION AND METHOD FOR AUTOMATIC FOCUS AND IMAGE CENTRE TRACKING FOR SUCH A DIGITAL MICROSCOPE
IMAGE CAPTURING DEVICE WITH A MOVING DEVICE FOR A DIGITAL MICROSCOPE, AND DIGITAL MICROSCOPE
METHOD FOR GENERATING A CONTRAST IMAGE OF AN OBJECT QUALITY AND RELATED DEVICES
METHOD FOR REFLECTION ADJUSTMENT OF IMAGES AND RELATED APPARATUS
CONFOCAL MICROSCOPE WITH APERTURE CORRELATION
METHOD FOR COMBINING TOMOGRAPHIC VOLUME DATA SETS AND IMAGE ANALYSIS TOOL OF AN X-RAY IMAGING MICROSCOPY SYSTEM
METHOD FOR CORRECTING ILLUMINATION-DEPENDENT ABERRATIONS IN A MODULAR DIGITAL MICROSCOPE, DIGITAL MICROSCOPE AND DATA PROCESSING PROGRAM
METHOD, TOOL AND COMPUTER PROGRAM PRODUCT FOR MEASUREMENT AND ESTIMATION OF AN X-RAY SOURCE SPRECTRUM IN COMPUTED TOMOGRAPHY, AND X-RAY CT SYSTEM
METHOD FOR GENERATING A REFLECTION-REDUCED CONTRAST IMAGE AND CORRESPONDING DEVICES