We have observed
5 EP applications
Petrus Henricus Johannes Broeken
has served for within the last five+ years.
(We consider all applications which have an EP A1 or A2 publication dated after April 26, 2013).
Please note, that we only count EP applications,
in which the name of the patent attorney is explicitly mentioned as representative.
These EP applications are:
PHOTON SOURCE, METROLOGY APPARATUS, LITHOGRAPHIC SYSTEM AND DEVICE MANUFACTURING METHOD
METHOD OF DESIGNING METROLOGY TARGETS, SUBSTRATES HAVING METROLOGY TARGETS, METHOD OF MEASURING OVERLAY, AND DEVICE MANUFACTURING METHOD
METROLOGY METHOD, COMPUTER PRODUCT AND SYSTEM
ILLUMINATION SOURCE FOR AN INSPECTION APPARATUS, INSPECTION APPARATUS AND INSPECTION METHOD
DEVICE AND METHOD FOR PROCESSING A RADIATION BEAM WITH COHERENCE