Representative before the EPO

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We have observed 5 EP applications Petrus Henricus Johannes Broeken has served for within the last five+ years. (We consider all applications which have an EP A1 or A2 publication dated after April 26, 2013). Please note, that we only count EP applications, in which the name of the patent attorney is explicitly mentioned as representative. These EP applications are:

EP13724291

PHOTON SOURCE, METROLOGY APPARATUS, LITHOGRAPHIC SYSTEM AND DEVICE MANUFACTURING METHOD

IPC classification:
G01N 21/956, G03F 7/20, H01J 61/02, H01J 61/54, H01J 65/04, H05B 41/38, H05G 2/00
Applicant:
ASML Netherlands B.V.
Agent:
Petrus Henricus Johannes Broeken, ASML Netherlands B.V.
Status:
GRANT OF PATENT INTENDED
EP14748178

METHOD OF DESIGNING METROLOGY TARGETS, SUBSTRATES HAVING METROLOGY TARGETS, METHOD OF MEASURING OVERLAY, AND DEVICE MANUFACTURING METHOD

IPC classification:
G03F 7/20
Applicant:
ASML Netherlands B.V.
Agent:
Petrus Henricus Johannes Broeken, ASML Netherlands B.V.
Status:
EXAMINATION REQUESTED
EP15787614

METROLOGY METHOD, COMPUTER PRODUCT AND SYSTEM

IPC classification:
G03F 7/20
Applicant:
ASML Netherlands B.V.
Agent:
Petrus Henricus Johannes Broeken, ASML Netherlands B.V.
Status:
Request for examination was made
EP16181778

ILLUMINATION SOURCE FOR AN INSPECTION APPARATUS, INSPECTION APPARATUS AND INSPECTION METHOD

IPC classification:
G03F 7/20
Applicant:
ASML Netherlands B.V.
Agent:
Petrus Henricus Johannes Broeken, ASML Netherlands B.V.
Status:
The application has been published
EP16182256

DEVICE AND METHOD FOR PROCESSING A RADIATION BEAM WITH COHERENCE

IPC classification:
G02B 6/42, G03F 7/20
Applicant:
ASML Netherlands B.V.
Agent:
Petrus Henricus Johannes Broeken, ASML Netherlands B.V.
Status:
The application has been published

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