Facts

Partner/Owner since 2009

Founder since 2009

Representative before the EPO

Employment test 11 - 50 employees
Company dna denk ip bvba
operating since 2009
939.76
Headquarter in Merelbeke and 3 offices
active in Legal Services, IP Consulting, and IP-related Communication Service

We have observed 42 EP applications Kris Hertoghe has served for within the last five+ years. (We consider all applications which have an EP A1 or A2 publication dated after June 15, 2013). Please note, that we only count EP applications, in which the name of the patent attorney is explicitly mentioned as representative. These EP applications are:

EP11826114

SOFT SPUTTERING MAGNETRON SYSTEM

IPC classification:
H01J 37/34, C23C 14/35
Applicant:
Soleras Advanced Coatings bvba
Agent:
Kris Hertoghe, DenK iP bvba
Status:
EXAMINATION REQUESTED
EP12162914

Floating diffusion pre-charge

IPC classification:
H04N 5/359, H04N 5/357
Agent:
Kris Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP12711874

FLAT FIELD TELECENTRIC SCANNER WITH DIFFRACTION LIMITED PERFORMANCE

IPC classification:
G02B 26/12, G02B 13/22, G02B 13/00
Agent:
Kris Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP12714271

METHOD FOR GROWING A MONOCRYSTALLINE TIN- CONTAINING SEMICONDUCTOR MATERIAL

IPC classification:
H01L 21/205, H01L 21/02
Applicant:
Katholieke Universiteit Leuven
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP11195473

Stacked RRAM array with integrated transistor selector

IPC classification:
G11C 13/00
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
EXAMINATION REQUESTED
EP12176741

Method for selective growth of highly doped group IV-Sn semiconductor materials

IPC classification:
H01L 21/02
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12165342

Device and method for holographic reflection imaging

IPC classification:
G03H 1/00, G03H 1/02, G03H 1/04
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
The patent has been granted
EP12165341

Device and method for holographic reflection imaging

IPC classification:
G03H 1/00, G03H 1/02, G03H 1/04
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
EXAMINATION IN PROGRESS
EP13174528

Communication system including device power communication

IPC classification:
H04B 3/54, H04L 25/02
Agent:
Kris Hertoghe, DenK iP bvba
Status:
APPLICATION WITHDRAWN
EP13187652

Method for determining and/or compensating range offset of a range sensor

IPC classification:
G01S 17/89, G01S 7/497
Applicant:
Melexis Technologies NV
Agent:
Kris Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP12756201

NON-INVASIVE IN-SITU RADIATION DOSIMETRY

IPC classification:
A61B 6/00, G01T 1/161, G01T 1/04, A61N 5/10
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13171572

Micro-stimulation and data acquisition from biological cells

IPC classification:
G01N 27/00, B82Y 30/00
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Hertoghe, DenK iP bvba
Status:
The patent has been granted
EP13154735

Digital camera and method of capturing an image

IPC classification:
H04N 17/00, H04N 5/335, H04N 5/217
Agent:
Kris Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11194761

Resistive memory array

IPC classification:
H01L 27/24, G11C 13/00
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14155046

Method and device for detecting analytes

IPC classification:
G01N 21/65
Applicant:
Panasonic Corporation
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12155246

Online adjustable magnet bar

IPC classification:
C23C 14/35, H01J 37/34
Applicant:
Soleras Advanced Coatings bvba
Agent:
Kris Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13160673

Image sensor with focus-detection pixel, and method for reading focus-information

IPC classification:
H04N 5/369, H04N 5/232
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13160709

Digital camera with focus-detection pixels used for light metering

IPC classification:
H04N 5/369, H04N 5/235, H04N 5/232
Agent:
Kris Hertoghe, DenK iP bvba
Status:
The patent has been granted
EP13162824

Two-step interconnect testing of semiconductor dies

IPC classification:
H01L 25/065, G01R 31/3185
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
The patent has been granted
EP12188795

Controlled toggle rate of non-test signals during modular scan testing of an integrated circuit

IPC classification:
G01R 31/3185
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12167042

Method for determining a stress value for isotropic stress and method for determining a magnetic field and stress sensor and Hall effect sensor

IPC classification:
G01R 33/09, G01L 1/18
Applicant:
Melexis Technologies NV
Agent:
Kris Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12726616

LOCAL CONNECTION OF SHEETS ONTO ONE ANOTHER, METHOD AND APPARATUS FOR THE IMPLEMENTATION THEREOF

IPC classification:
B65D 5/42, B65B 7/24, B31F 5/02
Agent:
Kris Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12189267

Transition delay detector for interconnect test

IPC classification:
G01R 31/3185, G01R 31/317
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13189012

Circuit and method for biasing a plate-shaped sensor element of semiconductor material

IPC classification:
G01R 33/07, G01R 33/00
Applicant:
Melexis Technologies NV
Agent:
Kris Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12818521

GYPSUM BOARD SUITABLE FOR WET OR HUMID AREAS

IPC classification:
E04C 2/04, B32B 13/14
Agent:
Wim August Maria Van Steenlandt, Redco NV-SA
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12169407

Transcranial magnetic stimulation for small animals

IPC classification:
A61N 2/02
Applicant:
University of Antwerp (Universiteit Antwerpen)
Agent:
Kris Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13172187

Self-rectifying RRAM element

IPC classification:
H01L 45/00, H01L 27/24
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP13196054

Integrated photonic devices with reduced sensitivity to external influences

IPC classification:
G02B 6/293, G02B 6/12
Applicant:
Ghent University (Universiteit Gent)
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
The patent has been granted
EP12199058

Tunable impedance network

IPC classification:
H03H 7/38
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13179010

Image sensor with shading detection

IPC classification:
H04N 5/369, H04N 5/357
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12184229

System and method for hotel reservation and for automated check-in

IPC classification:
G06Q 10/02
Agent:
Kris Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13187621

Selector for RRAM

IPC classification:
H01L 29/861, H01L 27/24
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP13187950

Adaptive noise filtering

IPC classification:
H04N 5/357, G06T 5/00
Agent:
Kris Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13193749

Method for decreasing the impedance of a titanium nitride electrode

IPC classification:
G01N 27/30, C25B 11/04
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13197303

Restoring OFF-state stress degradation of threshold voltage

IPC classification:
H03K 17/14, H01L 27/02
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP14178560

A method for providing an nMOS device and a pMOS device on a silicon substrate and silicon substrate comprising an nMOS device and a pMOS device

IPC classification:
H01L 29/10, H01L 27/092, H01L 21/8238
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Agent:
Office Kirkpatrick S.A.
Status:
GRANT OF PATENT INTENDED
EP12151482

Dark current correction for shutterless cameras

IPC classification:
H04N 5/361
Agent:
Kris Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP11755074

METHOD FOR FABRICATING THIN PHOTOVOLTAIC CELLS

IPC classification:
H01L 31/18
Applicant:
Katholieke Universiteit Leuven
Applicant:
IMEC VZW
Agent:
Kris Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12166696

Asymmetric full duplex communication with high tolerance for coax characteristic impedance

IPC classification:
H04L 25/02, H04B 3/54
Agent:
Kris Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12168326

Image sensor and method for power efficient readout of sub-picture

IPC classification:
H04N 5/378, H04N 5/374, H04N 5/345
Agent:
Kris Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP11195783

Imager with column readout

IPC classification:
H04N 5/376, H04N 5/345, H04N 5/3745
Agent:
Kris Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12154113

Method for correcting image data from an image sensor having image pixels and non-image pixels, and image sensor implementing the same

IPC classification:
G06T 3/40, H04N 9/04
Agent:
Kris Hertoghe, DenK iP bvba
Status:
PATENT GRANTED

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