Representative before the EPO

Employment test 11 - 50 employees
Company dna denk ip bvba
operating since 2009
812.64
Headquarter in Merelbeke and 1 office
active in Legal Services, IP Consulting, and IP-related Communication Service

Kris Angèle Louisa Hertoghe has worked on the following 52 EPO patent applications which have been published in the last five years:

EP11730870

INTENSITY NORMALIZATION IN IMAGING MASS SPECTROMETRY

IPC classification:
G06K 9/38, G06K 9/40
Applicant:
Katholieke Universiteit Leuven
Agent:
Bird Goën & Co NV
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP11826114

SOFT SPUTTERING MAGNETRON SYSTEM

IPC classification:
C23C 14/35, H01J 37/34
Applicant:
Soleras Advanced Coatings bvba
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
EXAMINATION REQUESTED
EP12162914

Floating diffusion pre-charge

IPC classification:
H04N 5/357, H04N 5/359
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP11186243

Method of forming MIM capacitor with Ru-comprising oxygen diffusion barrier

IPC classification:
C07F 15/00, C23C 16/06, C23C 16/40, H01L 21/02, H01L 21/285, H01L 21/768
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
EXAMINATION IN PROGRESS
EP11172969

Memory cell and method for manufacturing

IPC classification:
H01L 27/24
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12711874

FLAT FIELD TELECENTRIC SCANNER WITH DIFFRACTION LIMITED PERFORMANCE

IPC classification:
G02B 13/00, G02B 13/22, G02B 26/12
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP12714271

METHOD FOR GROWING A MONOCRYSTALLINE TIN- CONTAINING SEMICONDUCTOR MATERIAL

IPC classification:
H01L 21/02, H01L 21/205
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP11195473

Stacked RRAM array with integrated transistor selector

IPC classification:
G11C 13/00
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
EXAMINATION REQUESTED
EP11179446

Hand-held power wire saw and wire holder

IPC classification:
B23D 57/00
Applicant:
NV Bekaert SA
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12176741

Method for selective growth of highly doped group IV-Sn semiconductor materials

IPC classification:
H01L 21/02
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12189851

Systems and methods for manipulating objects

IPC classification:
B24B 9/16, B28D 5/00
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12165342

Device and method for holographic reflection imaging

IPC classification:
G03H 1/00, G03H 1/02, G03H 1/04
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
EXAMINATION IN PROGRESS
EP12165341

Device and method for holographic reflection imaging

IPC classification:
G03H 1/00, G03H 1/02, G03H 1/04
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
EXAMINATION IN PROGRESS
EP13174528

Communication system including device power communication

IPC classification:
H04B 3/54, H04L 25/02
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION WITHDRAWN
EP13187652

Method for determining and/or compensating range offset of a range sensor

IPC classification:
G01S 7/497, G01S 17/89
Applicant:
Melexis Technologies NV
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP12756201

NON-INVASIVE IN-SITU RADIATION DOSIMETRY

IPC classification:
A61B 6/00, A61N 5/10, G01T 1/04, G01T 1/161
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13171572

Micro-stimulation and data acquisition from biological cells

IPC classification:
B82Y 30/00, G01N 27/00
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13154735

Digital camera and method of capturing an image

IPC classification:
H04N 5/217, H04N 5/335, H04N 17/00
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11194761

Resistive memory array

IPC classification:
G11C 13/00, H01L 27/24
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14155046

Method and device for detecting analytes

IPC classification:
G01N 21/65
Applicant:
Panasonic Corporation
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12155246

Online adjustable magnet bar

IPC classification:
C23C 14/35, H01J 37/34
Applicant:
Soleras Advanced Coatings bvba
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13160673

Image sensor with focus-detection pixel, and method for reading focus-information

IPC classification:
H04N 5/232, H04N 5/369
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13160709

Digital camera with focus-detection pixels used for light metering

IPC classification:
H04N 5/232, H04N 5/235, H04N 5/369
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13162824

Two-step interconnect testing of semiconductor dies

IPC classification:
G01R 31/3185, H01L 25/065
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
EXAMINATION IN PROGRESS
EP12188795

Controlled toggle rate of non-test signals during modular scan testing of an integrated circuit

IPC classification:
G01R 31/3185
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12167042

Method for determining a stress value for isotropic stress and method for determining a magnetic field and stress sensor and Hall effect sensor

IPC classification:
G01L 1/18, G01R 33/09
Applicant:
Melexis Technologies NV
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12726616

LOCAL CONNECTION OF SHEETS ONTO ONE ANOTHER, METHOD AND APPARATUS FOR THE IMPLEMENTATION THEREOF

IPC classification:
B31F 5/02, B65B 7/24, B65D 5/42
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12189267

Transition delay detector for interconnect test

IPC classification:
G01R 31/317, G01R 31/3185
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13189012

Circuit and method for biasing a plate-shaped sensor element of semiconductor material

IPC classification:
G01R 33/00, G01R 33/07
Applicant:
Melexis Technologies NV
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12818521

GYPSUM BOARD SUITABLE FOR WET OR HUMID AREAS

IPC classification:
B32B 13/14, E04C 2/04
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Agent:
Wim August Maria Van Steenlandt, Redco NV-SA
Status:
GRANT OF PATENT INTENDED
EP13172187

Self-rectifying RRAM element

IPC classification:
H01L 27/24, H01L 45/00
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP12169407

Transcranial magnetic stimulation for small animals

IPC classification:
A61N 2/02
Applicant:
University of Antwerp (Universiteit Antwerpen)
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13196054

Integrated photonic devices with reduced sensitivity to external influences

IPC classification:
G02B 6/12, G02B 6/293
Applicant:
Ghent University (Universiteit Gent)
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12199058

Tunable impedance network

IPC classification:
H03H 7/38
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13179010

Image sensor with shading detection

IPC classification:
H04N 5/357, H04N 5/369
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12184229

System and method for hotel reservation and for automated check-in

IPC classification:
G06Q 10/02
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13187621

Selector for RRAM

IPC classification:
H01L 27/24, H01L 29/861
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP13187950

Adaptive noise filtering

IPC classification:
G06T 5/00, H04N 5/357
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13193749

Method for decreasing the impedance of a titanium nitride electrode

IPC classification:
C25B 11/04, G01N 27/30
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13197303

Restoring OFF-state stress degradation of threshold voltage

IPC classification:
H01L 27/02, H03K 17/14
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP14178560

A method for providing an nMOS device and a pMOS device on a silicon substrate and silicon substrate comprising an nMOS device and a pMOS device

IPC classification:
H01L 21/8238, H01L 27/092, H01L 29/10
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Agent:
Office Kirkpatrick S.A.
Status:
GRANT OF PATENT INTENDED
EP12177230

Methods for improving integrated photonic device uniformity

IPC classification:
G01B 11/02, G02B 6/12
Applicant:
Ghent University (Universiteit Gent)
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12151482

Dark current correction for shutterless cameras

IPC classification:
H04N 5/361
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP11755074

METHOD FOR FABRICATING THIN PHOTOVOLTAIC CELLS

IPC classification:
H01L 31/18
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12166696

Asymmetric full duplex communication with high tolerance for coax characteristic impedance

IPC classification:
H04B 3/54, H04L 25/02
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12168326

Image sensor and method for power efficient readout of sub-picture

IPC classification:
H04N 5/345, H04N 5/374, H04N 5/378
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP11733858

BRAKE SYSTEM FOR AN INDUSTRIAL GEARBOX

IPC classification:
B60T 17/00, F16D 63/00
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP11195783

Imager with column readout

IPC classification:
H04N 5/345, H04N 5/3745, H04N 5/376
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12187170

Determining rotor position in sensorless switched reluctance motors

IPC classification:
H02P 6/18, H02P 25/08
Applicant:
Melexis Technologies NV
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP11182533

Method and device for thermal insulation of micro-reactors

IPC classification:
B01L 3/00, B01L 7/00, B81B 3/00, B81B 7/00
Applicant:
Panasonic Corporation
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12166436

Analysis and sorting of biological cells in flow

IPC classification:
G01N 15/14, G03H 1/00
Applicant:
IMEC VZW
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED
EP12154113

Method for correcting image data from an image sensor having image pixels and non-image pixels, and image sensor implementing the same

IPC classification:
G06T 3/40, H04N 9/04
Agent:
Kris Angèle Louisa Hertoghe, DenK iP bvba
Status:
PATENT GRANTED

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