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Hendrik Bakker has worked on the following 186 EPO patent applications which have been published in the last five years:

EP11776378

METHOD OF PREPARING A BIOLOGICAL SAMPLE FOR INSPECTION WITH ELECTRON MICROSCOPY AND FLUORESCENT LIGHT MICROSCOPY

IPC classification:
G01N 1/31, G01N 1/42, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11172955

Silicon Drift Detector for use in a charged particle apparatus

IPC classification:
G01T 1/24, H01J 37/244, H01L 31/115
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12163262

Charged-particle microscope providing depth-resolved imagery

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11176401

Charged particle detector system comprising a conversion electrode

IPC classification:
H01J 37/244, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11177091

Charged-particle microscopy imaging method

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13183631

Method of performing tomographic imaging of a sample in a charged-particle microscope

IPC classification:
G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP12187384

Process for the manufacture of local nanostructures of high purity material

IPC classification:
C23C 16/48, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11184107

Method for acquiring data with an image sensor

IPC classification:
H04N 5/32, H04N 5/357, H04N 5/374
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12189372

Configurable charged-particle beam apparatus

IPC classification:
H01J 37/141, H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12189369

Beam pulsing device for use in charged-particle microscopy

IPC classification:
H01J 37/04, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11185734

Method for adjusting a STEM equipped with an aberration corrector

IPC classification:
H01J 37/153, H01J 37/20, H01J 37/26, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11185586

Scanning method for scanning a sample with a probe

IPC classification:
G01Q 30/06, G06T 5/50, G06T 7/00, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13176585

X-ray spectroscopic technique using merged spectral data

IPC classification:
G01N 23/223, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13176233

Forming an electron microscope sample from high-pressure frozen material

IPC classification:
G01N 1/28, G01N 1/42
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13184564

Improved cooling of electrical coil structure

IPC classification:
H01F 27/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12194321

Method of sampling a sample and displaying obtained information

IPC classification:
G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11187865

Charged-particle microscopy

IPC classification:
G06F 17/30, G06F 17/40, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12194825

Method of performing tomographic imaging of a sample in a charged-particle microscope

IPC classification:
H01J 37/21, H01J 37/22, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12194654

Signal based sample preparation

IPC classification:
G01N 1/31
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11193495

Clustering of multi-modal data

IPC classification:
G01N 23/04, G01N 23/22, G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11192525

Adjustment assist tool for charged particle microscope

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13154537

Sample preparation stage

IPC classification:
G01N 1/06, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP12834935

MICROSCOPE DEVICE

IPC classification:
G01N 21/63, G02B 21/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12155112

Forming a vitrified sample for an electron microscopy

IPC classification:
G01N 1/42, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13157564

Method of studying a cryogenic sample in an optical microscope

IPC classification:
G02B 21/28, G02B 27/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12157055

A holder assembly for cooperating with an environmental cell and an electron microscope

IPC classification:
H01J 37/20
Applicant:
FEI Company
Applicant:
Delft University of Technology (Technische Universiteit Delft)
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12183821

Cooperating capillary and cap for use in a high-pressure freezer

IPC classification:
G01N 1/42
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12183662

Method of using a compound particle-optical lens

IPC classification:
H01J 37/145, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13193643

Gas-assisted laser ablation

IPC classification:
B23K 26/06, B23K 26/12, B23K 26/16, B23K 26/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13162084

Low energy ion milling or deposition

IPC classification:
H01J 37/02, H01J 37/305, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12852813

HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE THINNING OF CROSS-SECTIONAL VIEW LAMELLA

IPC classification:
G01N 1/28, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13182113

Laser-induced deposition on a seed layer

IPC classification:
C23C 16/02, C23C 16/04, C23C 16/18
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13194217

Signal based sample preparation

IPC classification:
G01N 1/31, G01N 35/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12178060

Method of preparing and imaging a lamella in a particle-optical apparatus

IPC classification:
H01J 37/26, H01J 37/295, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13153164

Charged-particle microscope providing depth-resolved imagery

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12844105

SAMPLE BLOCK HOLDER

IPC classification:
G01N 1/36, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14165529

Method of using a phase plate in a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP13165356

Method of using a phase plate in a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12771056

SWITCHABLE MICROSCOPE ARRANGEMENT WITH MULTIPLE DETECTORS

IPC classification:
G01B 9/04, G01N 21/64, G02B 21/16, G02B 21/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12164724

Method for analyzing an EDS signal

IPC classification:
G01T 1/17, G01T 1/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12189255

Coated O-ring

IPC classification:
C23C 14/08, F16J 15/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12182874

Method of investigating and correcting aberrations in a charged-particle lens system

IPC classification:
H01J 37/153
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14169930

Precursor for planar deprocessing of semiconductor devices using a focused ion beam

IPC classification:
H01J 37/305, H01L 21/3213
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP12166368

Charged-particle microscopy with image stitching

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13170871

Method for electron tomography

IPC classification:
G01N 23/04
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13170553

Method for imaging a sample in a dual-beam charged particle apparatus

IPC classification:
H01J 37/147
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12171907

Focused charged particle column for operation at different beam energies at a target

IPC classification:
H01J 37/12, H01J 37/28, H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13194218

Method of performing tomographic imaging of a sample in a charged-particle microscope

IPC classification:
H01J 37/21, H01J 37/22, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13172127

Method of welding a frozen aqueous sample to a microprobe

IPC classification:
G01N 1/28, G01N 1/42, G02B 21/32, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP12171725

Charged-particle apparatus equipped with improved Wien-type Cc corrector

IPC classification:
H01J 37/153
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14173606

Plan view sample preparation

IPC classification:
G01N 1/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP13194212

Method of sampling a sample and displaying obtained information

IPC classification:
G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13180398

Charged-particle microscope with Raman spectroscopy capability

IPC classification:
G01N 21/65, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14176646

Magnetic lens for focusing a beam of charged particles

IPC classification:
H01J 37/14, H01J 37/141
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13176980

Magnetic lens for focusing a beam of charged particles

IPC classification:
H01J 37/14, H01J 37/141
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12831878

GLANCING ANGLE MILL

IPC classification:
G01N 1/28, H01J 37/26, H01J 37/30, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12176254

Forming an electron microscope sample from high-pressure frozen material

IPC classification:
G01N 1/42
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12177454

X-ray spectroscopic technique using merged spectral data

IPC classification:
G01N 23/223, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13179026

Use of electrostatic objective lens in an electron microscope

IPC classification:
H01J 37/12, H01J 37/145, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14180857

Detaching probe from TEM sample during sample preparation

IPC classification:
G01N 1/32, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13180022

Method of using an environmental transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14180858

Circuit probe for charged particle beam system

IPC classification:
G01R 31/28, H01J 37/20, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14180462

Method of using an environmental transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP13151244

Sample carrier for an electron microscope

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13152215

Method of observing samples with a fluorescent microscope

IPC classification:
G01N 21/64, G02B 21/08, G02B 21/16
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12180595

Method of performing EDX in a charged-particle microscope

IPC classification:
H01J 37/244, H01J 37/256, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12184099

Method of performing tomographic imaging of a sample in a charged-particle microscope

IPC classification:
G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12182334

Imaging a sample in a TEM equipped with a phase plate

IPC classification:
H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13793928

PREPARATION OF LAMELLAE FOR TEM VIEWING

IPC classification:
H01J 37/08, H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP13186632

Preparation of cryogenic sample for charged-particle microscopy

IPC classification:
F25D 3/11, G01N 1/20, G01N 1/28, G01N 1/31, G01N 1/42, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12168997

Improved phase plate for a TEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15156053

Method of examining a sample in a charged-particle microscope

IPC classification:
H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14190566

Integrated lamellae extraction station

IPC classification:
G01N 1/28, G01N 1/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14190567

Differential imaging with pattern recognition for process automation of cross sectioning applications

IPC classification:
H01J 37/304, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13808743

Multi Species Ion Source

IPC classification:
H01J 37/08, H01J 37/147, H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13810227

CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET

IPC classification:
G01N 23/203, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12881505

ENDPOINTING FOR FOCUSED ION BEAM PROCESSING

IPC classification:
H01J 37/317, H01L 21/265
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14193565

Phase plate for a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14195296

Charged-particle microscopy with enhanced electron detection

IPC classification:
G01N 23/225, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13195289

Charged-particle microscopy with enhanced electron detection

IPC classification:
G01N 23/225, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14195297

Method of producing a freestanding thin film of nano-crystalline graphite

IPC classification:
C23C 16/26, H01J 37/20, H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13195596

Method of producing a freestanding thin film of nano-crystalline carbon

IPC classification:
C23C 16/26, H01J 37/20, H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13826116

AUTOMATED EDS STANDARDS CALIBRATION

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13825971

ENVIRONMENTAL SEM GAS INJECTION SYSTEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13198059

Method of investigating the wavefront of a charged-particle beam

IPC classification:
H01J 37/295
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14152582

Correlative optical and charged particle microscope

IPC classification:
H01J 37/22, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15152977

Surface delayering with a programmed manipulator

IPC classification:
B26D 3/28, B28D 5/04, G01N 1/06, G03F 1/00, G03F 1/72, G03F 7/20, H01L 21/304
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP13843585

MULTIDIMENSIONAL STRUCTURAL ACCESS

IPC classification:
H01L 21/66
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP13843746

BULK DEPOSITION FOR TILTED MILL PROTECTION

IPC classification:
B23K 15/00, B23K 15/08, C23F 4/04
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13843083

METHOD AND SYSTEM FOR REDUCING CURTAINING IN CHARGED PARTICLE BEAM SAMPLE PREPARATION

IPC classification:
H01L 21/66
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13844339

HIGH ASPECT RATIO STRUCTURE ANALYSIS

IPC classification:
B23K 15/08, G01B 15/00, G01N 1/32, G01N 23/00, H01J 37/305, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13849908

AUTOMATED MINERAL CLASSIFICATION

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11176445

Method of studying a sample in an ETEM

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP15157492

Fabrication of a Lamella for Correlative Atomic-Resolution Tomographic Analyses

IPC classification:
G01N 1/28, G01N 1/36, H01J 37/285
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP14169243

Fabrication of a lamella for correlative atomic-resolution tomographic analyses

IPC classification:
G01N 1/28, G01N 1/36, H01J 37/285
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15160701

Imaging a sample with multiple beams and multiple detectors

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14161505

Imaging a sample with multiple beams and multiple detectors

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14161519

Imaging a sample with multiple beams and a single detector

IPC classification:
H01J 37/28, H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12188958

Scanning method for scanning a sample with a probe

IPC classification:
B82Y 35/00, G01Q 30/06, G06T 5/50, G06T 7/00, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15163360

HIGH CAPACITY TEM GRID

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP14172692

High capacity tem grid

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13869553

PROCESS FOR PERFORMING AUTOMATED MINERALOGY

IPC classification:
G01N 23/203, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP13868669

DEPOSITING MATERIAL INTO HIGH ASPECT RATIO STRUCTURES

IPC classification:
H01L 21/205
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13867985

FIDUCIAL DESIGN FOR TILTED OR GLANCING MILL OPERATIONS WITH A CHARGED PARTICLE BEAM

IPC classification:
H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14737997

ION IMPLANTATION TO ALTER ETCH RATE

IPC classification:
G01N 1/28, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP14170775

Surface delayering with a programmed manipulator

IPC classification:
B26D 3/28, B28D 5/04, G01N 1/06, H01L 21/304
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14172871

Mathematical image assembly in a scanning-type microscope

IPC classification:
G02B 21/00, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15172227

MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE

IPC classification:
G02B 21/00, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP14174903

Computational scanning microscopy with improved resolution

IPC classification:
G02B 21/00, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15174190

COMPUTATIONAL SCANNING MICROSCOPY WITH IMPROVED RESOLUTION

IPC classification:
G02B 21/00, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15173248

METHOD AND SYSTEM OF CREATING SYMMETRICAL FIB DEPOSITION

IPC classification:
H01J 37/305, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14173457

Blend modes for mineralogy images

IPC classification:
G01N 23/00, G06T 11/00, G06T 15/50
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14176529

Method of calibrating a scanning transmission charged-particle microscope

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15174497

ELECTROSTATIC LENS TRANSMISSIVE FOR EMISSIONS FROM A SAMPLE

IPC classification:
H01J 37/12, H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15181994

IMPROVED RADIATION SENSOR, AND ITS APPLICATION IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/244, H01L 27/146, H01L 31/105
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14182139

Method of acquiring EBSP patterns

IPC classification:
G01N 23/203, H01J 37/244, H01J 37/252
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14182128

Improved radiation sensor, and its application in a charged-particle microscope

IPC classification:
H01J 37/244, H01L 27/146, H01L 31/105
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14183576

Method of performing spectroscopy in a transmission charged-particle microscope

IPC classification:
H01J 37/05, H01J 37/09, H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15183309

METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/05, H01J 37/09, H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15182001

METHOD OF ACQUIRING EBSP PATTERNS

IPC classification:
G01N 23/20, G01N 23/203, G01N 23/225, H01J 37/244, H01J 37/252
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP15184210

AUTOSLICE AND VIEW UNDERCUT METHOD

IPC classification:
G01N 1/28, G01N 1/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP14185799

Improved spectroscopy in a transmission charged-particle microscope

IPC classification:
H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15150310

CHICANE BLANKER ASSEMBLIES FOR CHARGED PARTICLE BEAM SYSTEMS AND METHODS OF USING THE SAME

IPC classification:
H01J 37/04, H01J 37/05
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14188029

Aligning a featureless thin film in a TEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14187878

Conditioning of a hole-free phase plate in a TEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14189135

Charged Particle Microscope with special aperture plate

IPC classification:
H01J 37/09, H01J 37/26, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP12194516

Inductively coupled plasma source as an electron beam source for spectroscopic analysis

IPC classification:
G01T 1/28, H01J 27/16, H01J 37/05, H01J 37/077, H01J 37/08, H01J 37/26, H01J 37/30, H01J 37/304, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14190703

Composite scan path in a charged particle microscope

IPC classification:
H01J 37/26, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15192862

AUTOMATED TEM SAMPLE PREPARATION

IPC classification:
G01N 1/28, H01J 37/304
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15193785

CHARGED PARTICLE MICROSCOPE WITH BAROMETRIC PRESSURE CORRECTION

IPC classification:
H01J 37/02, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15193787

CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/20, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14192805

Charged Particle Microscope with barometric pressure correction

IPC classification:
H01J 37/02, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14192853

Contactless temperature measurement in a charged particle microscope

IPC classification:
H01J 37/20, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP14197422

Improved cryogenic specimen holder for a charged particle microscope

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15199728

FIDUCIAL-BASED CORRELATIVE MICROSCOPY

IPC classification:
G01N 21/64, G02B 21/36, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP14199616

Improved specimen holder for a charged particle microscope

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13161507

Apparatus for and method of protecting light optical components during laser ablation

IPC classification:
B23K 26/00, B23K 26/03, B23K 26/12, B23K 26/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14200596

Charged Particle Microscope with improved spectroscopic functionality

IPC classification:
G01N 23/223, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15150779

Method of modifying a sample surface layer from a microscopic sample

IPC classification:
G01N 1/44, H01J 37/20, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15150996

Multipole magnetic lens for manipulating a beam of charged particles

IPC classification:
H01J 37/14, H01J 37/153
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP12173972

Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (IPC) ion source

IPC classification:
H01J 37/08, H01J 37/18
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12187329

Method for acquiring data with an image sensor

IPC classification:
H04N 5/32, H04N 5/357, H04N 5/374
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12173975

Silicon Drift Detector for use in a charged particle apparatus

IPC classification:
G01T 1/24, H01J 37/244, H01L 31/115
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13160075

Multiple gas injection system

IPC classification:
B05B 1/00, B05B 1/30, F16K 11/00, F16K 11/07, H01J 37/02, H01J 37/16, H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP16156848

PULSE PROCESSING

IPC classification:
G01T 1/17
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15156716

Pulse processing

IPC classification:
G01T 1/17
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16156892

SAMPLE-SPECIFIC REFERENCE SPECTRA LIBRARY

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15159339

METHODS AND SYSTEMS FOR MANAGING MULTIPLE VERSIONS OF A PROCESS IN A PROCESSING CHAIN

IPC classification:
G06T 5/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15156546

Preparation of sample for charged-particle microscopy

IPC classification:
G01N 1/28, G01N 1/42, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15156537

Multi-source GIS for particle-optical apparatus

IPC classification:
H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15192573

POST COLUMN FILTER WITH ENHANCED ENERGY RANGE

IPC classification:
H01J 37/05, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12738768

TEM SAMPLE PREPARATION

IPC classification:
G01N 1/28, H01J 37/20, H01J 37/26, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15159132

PATTERN MATCHING USING A LAMELLA OF KNOWN SHAPE FOR AUTOMATED S/TEM ACQUISITION AND METROLOGY

IPC classification:
G06T 1/00, H01J 37/22, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15159576

APPARATUS AND METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/05, H01J 37/244, H01J 37/28, H01L 27/146, H01L 31/107, H04N 5/3745
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15161138

Sample-specific reference spectra library

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16162513

CHARGED PARTICLE BEAM PROCESSING USING PROCESS GAS AND COOLED SURFACE

IPC classification:
H01J 37/18, H01J 37/305, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP16164988

METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGED PARTICLE APPARATUS

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15163623

METHOD AND SCANNING TRANSMISSION TYPE CHARGED-PARTICLE MICROSCOPE FOR PERFORMING TOMOGRAPHIC IMAGING

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15163671

METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGED PARTICLE APPARATUS

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP16167122

ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANALYSIS

IPC classification:
H01J 37/26, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP16169828

ELECTRON BEAM MICROSCOPE WITH IMPROVED IMAGING GAS AND METHOD OF USE

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP15169668

ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANALYSIS

IPC classification:
H01J 37/26, H01J 61/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16172498

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
G01N 1/28, H01J 37/26, H01J 37/304, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15171227

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
G01N 1/28, H01J 37/26, H01J 37/304, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15172752

METHOD OF PTYCHOGRAPHIC IMAGING

IPC classification:
G01N 23/04, G06T 11/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15174195

INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS

IPC classification:
H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16177044

ADAPTIVE BEAM CURRENT FOR HIGH THROUGHPUT PATTERNING

IPC classification:
H01J 37/302
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15178825

MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15178757

SCAN PATTERN IN A CHARGED PARTICLE MICROSCOPE COMPRISING NESTED ORBITAL WINDINGS

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15178449

TEM SAMPLE MOUNTING GEOMETRY

IPC classification:
G01N 1/32, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15181202

NOVEL ACQUISITION AND PROCESSING OF DATA IN A TOMOGRAPHIC IMAGING APPARATUS

IPC classification:
G06T 11/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16157199

STUDYING DYNAMIC SPECIMEN BEHAVIOR IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/04, H01J 37/147, H01J 37/244, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15182129

POSITIONAL ERROR CORRECTION IN A TOMOGRAPHIC IMAGING APPARATUS

IPC classification:
G06T 11/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15186664

CHARGED PARTICLE MICROSCOPE WITH IMPROVED SPECTROSCOPIC FUNCTIONALITY

IPC classification:
H01J 37/244, H01J 37/26
Applicant:
FEI Company
Applicant:
UChicago Argonne, LLC
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15188185

ADAPTIVE BEAM CURRENT FOR HIGH THROUGHPUT PATTERNING

IPC classification:
H01J 37/302
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15189500

INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
G01T 1/20, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15192523

CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION/CORRECTION

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16196521

METHOD FOR OPTIMIZING CHARGED PARTICLE BEAMS FORMED BY SHAPED APERTURES

IPC classification:
H01J 37/31
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16198005

METHOD FOR DETECTING PARTICULATE RADIATION

IPC classification:
G01T 1/24
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15193784

SYSTEMS AND METHODS FOR IMAGING DEVICE INTERFACES

IPC classification:
H04N 17/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15800579

METHOD AND APPARATUS FOR SLICE AND VIEW SAMPLE IMAGING

IPC classification:
H01J 37/08, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15195079

NOVEL X-RAY IMAGING TECHNIQUE

IPC classification:
G01N 23/04, H01J 35/08
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15196917

FILTER ASSEMBLY FOR DISCRIMINATING SECONDARY AND BACKSCATTERED ELECTRONS IN A NON-TRANSMISSION CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/05, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP17150603

BEAM-INDUCED ETCHING

IPC classification:
H01J 37/305, H01L 21/306, H01L 21/3065
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The application has been published
EP16194724

CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/18
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP16152964

HOLDER ASSEMBLY FOR COOPERATING WITH A NANOREACTOR AND AN ELECTRON MICROSCOPE

IPC classification:
H01J 37/18, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made

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