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We have observed 176 EP applications Hendrik Bakker has served for within the last five+ years. (We consider all applications which have an EP A1 publication dated after January 24, 2013). Please note, that we only count EP applications, in which the name of the patent attorney is explicitly mentioned as representative. These EP applications are:

EP13183631

Method of performing tomographic imaging of a sample in a charged-particle microscope

IPC classification:
G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP12187384

Process for the manufacture of local nanostructures of high purity material

IPC classification:
C23C 16/48, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12189372

Configurable charged-particle beam apparatus

IPC classification:
H01J 37/141, H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12189369

Beam pulsing device for use in charged-particle microscopy

IPC classification:
H01J 37/04, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13176585

X-ray spectroscopic technique using merged spectral data

IPC classification:
G01N 23/223, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13176233

Forming an electron microscope sample from high-pressure frozen material

IPC classification:
G01N 1/28, G01N 1/42
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13184564

Improved cooling of electrical coil structure

IPC classification:
H01F 27/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12194321

Method of sampling a sample and displaying obtained information

IPC classification:
G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12194825

Method of performing tomographic imaging of a sample in a charged-particle microscope

IPC classification:
H01J 37/21, H01J 37/22, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12194654

Signal based sample preparation

IPC classification:
G01N 1/31
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13154537

Sample preparation stage

IPC classification:
G01N 1/06, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP12834935

MICROSCOPE DEVICE

IPC classification:
G01N 21/63, G02B 21/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP13157564

Method of studying a cryogenic sample in an optical microscope

IPC classification:
G02B 21/28, G02B 27/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12183821

Cooperating capillary and cap for use in a high-pressure freezer

IPC classification:
G01N 1/42
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12183662

Method of using a compound particle-optical lens

IPC classification:
H01J 37/145, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13193643

Gas-assisted laser ablation

IPC classification:
B23K 26/06, B23K 26/12, B23K 26/16, B23K 26/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13162084

Low energy ion milling or deposition

IPC classification:
H01J 37/02, H01J 37/305, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12852813

HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE THINNING OF CROSS-SECTIONAL VIEW LAMELLA

IPC classification:
G01N 1/28, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13182113

Laser-induced deposition on a seed layer

IPC classification:
C23C 16/02, C23C 16/04, C23C 16/18
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13194217

Signal based sample preparation

IPC classification:
G01N 1/31, G01N 35/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12178060

Method of preparing and imaging a lamella in a particle-optical apparatus

IPC classification:
H01J 37/26, H01J 37/295, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13153164

Charged-particle microscope providing depth-resolved imagery

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12844105

SAMPLE BLOCK HOLDER

IPC classification:
G01N 1/36, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14165529

Method of using a phase plate in a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP13165356

Method of using a phase plate in a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12771056

SWITCHABLE MICROSCOPE ARRANGEMENT WITH MULTIPLE DETECTORS

IPC classification:
G01B 9/04, G01N 21/64, G02B 21/16, G02B 21/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12164724

Method for analyzing an EDS signal

IPC classification:
G01T 1/17, G01T 1/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP11851209

RECONSTRUCTION OF DYNAMIC MULTI-DIMENSIONAL IMAGE DATA

IPC classification:
G06F 15/00, G06F 17/00, G06F 19/00
Applicant:
FEI Company
Applicant:
Australian National University
Agent:
Zacco Denmark A/S
Agent:
Hendrik Bakker, FEI Company
Agent:
Jonas Tor Olofsson, Zacco Sweden AB
Status:
EXAMINATION REQUESTED
EP12189255

Coated O-ring

IPC classification:
C23C 14/08, F16J 15/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12182874

Method of investigating and correcting aberrations in a charged-particle lens system

IPC classification:
H01J 37/153
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14169930

Precursor for planar deprocessing of semiconductor devices using a focused ion beam

IPC classification:
H01J 37/305, H01L 21/3213
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP12166368

Charged-particle microscopy with image stitching

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13170871

Method for electron tomography

IPC classification:
G01N 23/04
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13170553

Method for imaging a sample in a dual-beam charged particle apparatus

IPC classification:
H01J 37/147
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12171907

Focused charged particle column for operation at different beam energies at a target

IPC classification:
H01J 37/12, H01J 37/28, H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13194218

Method of performing tomographic imaging of a sample in a charged-particle microscope

IPC classification:
H01J 37/21, H01J 37/22, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13172127

Method of welding a frozen aqueous sample to a microprobe

IPC classification:
G01N 1/28, G01N 1/42, G02B 21/32, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP12171725

Charged-particle apparatus equipped with improved Wien-type Cc corrector

IPC classification:
H01J 37/153
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14173606

Plan view sample preparation

IPC classification:
G01N 1/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP13194212

Method of sampling a sample and displaying obtained information

IPC classification:
G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13180398

Charged-particle microscope with Raman spectroscopy capability

IPC classification:
G01N 21/65, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14176646

Magnetic lens for focusing a beam of charged particles

IPC classification:
H01J 37/14, H01J 37/141
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13176980

Magnetic lens for focusing a beam of charged particles

IPC classification:
H01J 37/14, H01J 37/141
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12831878

GLANCING ANGLE MILL

IPC classification:
G01N 1/28, H01J 37/26, H01J 37/30, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12176254

Forming an electron microscope sample from high-pressure frozen material

IPC classification:
G01N 1/42
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12177454

X-ray spectroscopic technique using merged spectral data

IPC classification:
G01N 23/223, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13179026

Use of electrostatic objective lens in an electron microscope

IPC classification:
H01J 37/12, H01J 37/145, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14180857

Detaching probe from TEM sample during sample preparation

IPC classification:
G01N 1/32, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13180022

Method of using an environmental transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14180858

Circuit probe for charged particle beam system

IPC classification:
G01R 31/28, H01J 37/20, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14180462

Method of using an environmental transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP13151244

Sample carrier for an electron microscope

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13152215

Method of observing samples with a fluorescent microscope

IPC classification:
G01N 21/64, G02B 21/08, G02B 21/16
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12180595

Method of performing EDX in a charged-particle microscope

IPC classification:
H01J 37/244, H01J 37/256, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12184099

Method of performing tomographic imaging of a sample in a charged-particle microscope

IPC classification:
G01N 23/225, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12182334

Imaging a sample in a TEM equipped with a phase plate

IPC classification:
H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13793928

PREPARATION OF LAMELLAE FOR TEM VIEWING

IPC classification:
H01J 37/08, H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP13186632

Preparation of cryogenic sample for charged-particle microscopy

IPC classification:
F25D 3/11, G01N 1/20, G01N 1/28, G01N 1/31, G01N 1/42, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12168997

Improved phase plate for a TEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15156053

Method of examining a sample in a charged-particle microscope

IPC classification:
H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14190566

Integrated lamellae extraction station

IPC classification:
G01N 1/28, G01N 1/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14190567

Differential imaging with pattern recognition for process automation of cross sectioning applications

IPC classification:
H01J 37/304, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13808743

Multi Species Ion Source

IPC classification:
H01J 37/08, H01J 37/147, H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13810227

CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET

IPC classification:
G01N 23/203, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12881505

ENDPOINTING FOR FOCUSED ION BEAM PROCESSING

IPC classification:
H01J 37/317, H01L 21/265
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14193565

Phase plate for a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14195296

Charged-particle microscopy with enhanced electron detection

IPC classification:
G01N 23/225, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13195289

Charged-particle microscopy with enhanced electron detection

IPC classification:
G01N 23/225, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14195297

Method of producing a freestanding thin film of nano-crystalline graphite

IPC classification:
C23C 16/26, H01J 37/20, H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13195596

Method of producing a freestanding thin film of nano-crystalline carbon

IPC classification:
C23C 16/26, H01J 37/20, H01J 37/26
Applicant:
FEI Company
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13826116

AUTOMATED EDS STANDARDS CALIBRATION

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13825971

ENVIRONMENTAL SEM GAS INJECTION SYSTEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13198059

Method of investigating the wavefront of a charged-particle beam

IPC classification:
H01J 37/295
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14152582

Correlative optical and charged particle microscope

IPC classification:
H01J 37/22, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15152977

Surface delayering with a programmed manipulator

IPC classification:
B26D 3/28, B28D 5/04, G01N 1/06, G03F 1/00, G03F 1/72, G03F 7/20, H01L 21/304
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP13843585

MULTIDIMENSIONAL STRUCTURAL ACCESS

IPC classification:
H01L 21/66
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP13843746

BULK DEPOSITION FOR TILTED MILL PROTECTION

IPC classification:
B23K 15/00, B23K 15/08, C23F 4/04
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13843083

METHOD AND SYSTEM FOR REDUCING CURTAINING IN CHARGED PARTICLE BEAM SAMPLE PREPARATION

IPC classification:
H01L 21/66
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13844339

HIGH ASPECT RATIO STRUCTURE ANALYSIS

IPC classification:
B23K 15/08, G01B 15/00, G01N 1/32, G01N 23/00, H01J 37/305, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13849908

AUTOMATED MINERAL CLASSIFICATION

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15157492

Fabrication of a Lamella for Correlative Atomic-Resolution Tomographic Analyses

IPC classification:
G01N 1/28, G01N 1/36, H01J 37/285
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP14169243

Fabrication of a lamella for correlative atomic-resolution tomographic analyses

IPC classification:
G01N 1/28, G01N 1/36, H01J 37/285
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15160701

Imaging a sample with multiple beams and multiple detectors

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14161505

Imaging a sample with multiple beams and multiple detectors

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14161519

Imaging a sample with multiple beams and a single detector

IPC classification:
H01J 37/28, H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15163360

HIGH CAPACITY TEM GRID

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP14172692

High capacity tem grid

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13869553

PROCESS FOR PERFORMING AUTOMATED MINERALOGY

IPC classification:
G01N 23/203, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP13868669

DEPOSITING MATERIAL INTO HIGH ASPECT RATIO STRUCTURES

IPC classification:
H01L 21/205
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13867985

FIDUCIAL DESIGN FOR TILTED OR GLANCING MILL OPERATIONS WITH A CHARGED PARTICLE BEAM

IPC classification:
H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14737997

ION IMPLANTATION TO ALTER ETCH RATE

IPC classification:
G01N 1/28, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP14170775

Surface delayering with a programmed manipulator

IPC classification:
B26D 3/28, B28D 5/04, G01N 1/06, H01L 21/304
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14172871

Mathematical image assembly in a scanning-type microscope

IPC classification:
G02B 21/00, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15172227

MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE

IPC classification:
G02B 21/00, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP14174903

Computational scanning microscopy with improved resolution

IPC classification:
G02B 21/00, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15174190

COMPUTATIONAL SCANNING MICROSCOPY WITH IMPROVED RESOLUTION

IPC classification:
G02B 21/00, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15173248

METHOD AND SYSTEM OF CREATING SYMMETRICAL FIB DEPOSITION

IPC classification:
H01J 37/305, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14173457

Blend modes for mineralogy images

IPC classification:
G01N 23/00, G06T 11/00, G06T 15/50
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14176529

Method of calibrating a scanning transmission charged-particle microscope

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15174497

ELECTROSTATIC LENS TRANSMISSIVE FOR EMISSIONS FROM A SAMPLE

IPC classification:
H01J 37/12, H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15181994

IMPROVED RADIATION SENSOR, AND ITS APPLICATION IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/244, H01L 27/146, H01L 31/105
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14182139

Method of acquiring EBSP patterns

IPC classification:
G01N 23/203, H01J 37/244, H01J 37/252
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14182128

Improved radiation sensor, and its application in a charged-particle microscope

IPC classification:
H01J 37/244, H01L 27/146, H01L 31/105
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14183576

Method of performing spectroscopy in a transmission charged-particle microscope

IPC classification:
H01J 37/05, H01J 37/09, H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15183309

METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/05, H01J 37/09, H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15182001

METHOD OF ACQUIRING EBSP PATTERNS

IPC classification:
G01N 23/20, G01N 23/203, G01N 23/225, H01J 37/244, H01J 37/252
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP15184210

AUTOSLICE AND VIEW UNDERCUT METHOD

IPC classification:
G01N 1/28, G01N 1/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP14185799

Improved spectroscopy in a transmission charged-particle microscope

IPC classification:
H01J 37/244, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15150310

CHICANE BLANKER ASSEMBLIES FOR CHARGED PARTICLE BEAM SYSTEMS AND METHODS OF USING THE SAME

IPC classification:
H01J 37/04, H01J 37/05
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14188029

Aligning a featureless thin film in a TEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14187878

Conditioning of a hole-free phase plate in a TEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14189135

Charged Particle Microscope with special aperture plate

IPC classification:
H01J 37/09, H01J 37/26, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14190703

Composite scan path in a charged particle microscope

IPC classification:
H01J 37/26, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15192862

AUTOMATED TEM SAMPLE PREPARATION

IPC classification:
G01N 1/28, H01J 37/304
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15193785

CHARGED PARTICLE MICROSCOPE WITH BAROMETRIC PRESSURE CORRECTION

IPC classification:
H01J 37/02, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15193787

CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/20, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14192805

Charged Particle Microscope with barometric pressure correction

IPC classification:
H01J 37/02, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14192853

Contactless temperature measurement in a charged particle microscope

IPC classification:
H01J 37/20, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP14197422

Improved cryogenic specimen holder for a charged particle microscope

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15199728

FIDUCIAL-BASED CORRELATIVE MICROSCOPY

IPC classification:
G01N 21/64, G02B 21/36, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP14199616

Improved specimen holder for a charged particle microscope

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13161507

Apparatus for and method of protecting light optical components during laser ablation

IPC classification:
B23K 26/00, B23K 26/03, B23K 26/12, B23K 26/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14200596

Charged Particle Microscope with improved spectroscopic functionality

IPC classification:
G01N 23/223, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15150779

Method of modifying a sample surface layer from a microscopic sample

IPC classification:
G01N 1/44, H01J 37/20, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15150996

Multipole magnetic lens for manipulating a beam of charged particles

IPC classification:
H01J 37/14, H01J 37/153
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16156848

PULSE PROCESSING

IPC classification:
G01T 1/17
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15156716

Pulse processing

IPC classification:
G01T 1/17
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16156892

SAMPLE-SPECIFIC REFERENCE SPECTRA LIBRARY

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP15159339

METHODS AND SYSTEMS FOR MANAGING MULTIPLE VERSIONS OF A PROCESS IN A PROCESSING CHAIN

IPC classification:
G06T 5/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15156546

Preparation of sample for charged-particle microscopy

IPC classification:
G01N 1/28, G01N 1/42, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15156537

Multi-source GIS for particle-optical apparatus

IPC classification:
H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15192573

POST COLUMN FILTER WITH ENHANCED ENERGY RANGE

IPC classification:
H01J 37/05, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12738768

TEM SAMPLE PREPARATION

IPC classification:
G01N 1/28, H01J 37/20, H01J 37/26, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15159132

PATTERN MATCHING USING A LAMELLA OF KNOWN SHAPE FOR AUTOMATED S/TEM ACQUISITION AND METROLOGY

IPC classification:
G06T 1/00, H01J 37/22, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15159576

APPARATUS AND METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/05, H01J 37/244, H01J 37/28, H01L 27/146, H01L 31/107, H04N 5/3745
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15161138

Sample-specific reference spectra library

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16162513

CHARGED PARTICLE BEAM PROCESSING USING PROCESS GAS AND COOLED SURFACE

IPC classification:
H01J 37/18, H01J 37/305, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP16164988

METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGED PARTICLE APPARATUS

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15163623

METHOD AND SCANNING TRANSMISSION TYPE CHARGED-PARTICLE MICROSCOPE FOR PERFORMING TOMOGRAPHIC IMAGING

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP15163671

METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGED PARTICLE APPARATUS

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP16167122

ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANALYSIS

IPC classification:
H01J 37/26, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP16169828

ELECTRON BEAM MICROSCOPE WITH IMPROVED IMAGING GAS AND METHOD OF USE

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP15169668

ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANALYSIS

IPC classification:
H01J 37/26, H01J 61/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16172498

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
G01N 1/28, H01J 37/26, H01J 37/304, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15171227

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
G01N 1/28, H01J 37/26, H01J 37/304, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15172752

METHOD OF PTYCHOGRAPHIC IMAGING

IPC classification:
G01N 23/04, G06T 11/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15174195

INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS

IPC classification:
H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16177044

ADAPTIVE BEAM CURRENT FOR HIGH THROUGHPUT PATTERNING

IPC classification:
H01J 37/302
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15178825

MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15178757

SCAN PATTERN IN A CHARGED PARTICLE MICROSCOPE COMPRISING NESTED ORBITAL WINDINGS

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15178449

TEM SAMPLE MOUNTING GEOMETRY

IPC classification:
G01N 1/32, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15181202

NOVEL ACQUISITION AND PROCESSING OF DATA IN A TOMOGRAPHIC IMAGING APPARATUS

IPC classification:
G06T 11/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP16157199

STUDYING DYNAMIC SPECIMEN BEHAVIOR IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/04, H01J 37/147, H01J 37/244, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15182129

POSITIONAL ERROR CORRECTION IN A TOMOGRAPHIC IMAGING APPARATUS

IPC classification:
G06T 11/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15186664

CHARGED PARTICLE MICROSCOPE WITH IMPROVED SPECTROSCOPIC FUNCTIONALITY

IPC classification:
H01J 37/244, H01J 37/26
Applicant:
FEI Company
Applicant:
UChicago Argonne, LLC
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15188185

ADAPTIVE BEAM CURRENT FOR HIGH THROUGHPUT PATTERNING

IPC classification:
H01J 37/302
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15189500

INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
G01T 1/20, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15192523

CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION/CORRECTION

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16196521

METHOD FOR OPTIMIZING CHARGED PARTICLE BEAMS FORMED BY SHAPED APERTURES

IPC classification:
H01J 37/31
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16198005

METHOD FOR DETECTING PARTICULATE RADIATION

IPC classification:
G01T 1/24
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15193784

SYSTEMS AND METHODS FOR IMAGING DEVICE INTERFACES

IPC classification:
H04N 17/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15800579

METHOD AND APPARATUS FOR SLICE AND VIEW SAMPLE IMAGING

IPC classification:
H01J 37/08, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP15195079

NOVEL X-RAY IMAGING TECHNIQUE

IPC classification:
G01N 23/04, H01J 35/08
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15196917

FILTER ASSEMBLY FOR DISCRIMINATING SECONDARY AND BACKSCATTERED ELECTRONS IN A NON-TRANSMISSION CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/05, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP17150603

BEAM-INDUCED ETCHING

IPC classification:
H01J 37/305, H01L 21/306, H01L 21/3065
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The application has been published
EP16194724

CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/18
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP16152964

HOLDER ASSEMBLY FOR COOPERATING WITH A NANOREACTOR AND AN ELECTRON MICROSCOPE

IPC classification:
H01J 37/18, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The patent has been granted
EP16153875

CHARGED-PARTICLE MICROSCOPE WITH ASTIGMATISM COMPENSATION AND ENERGY-SELECTION

IPC classification:
H01J 37/05, H01J 37/153
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP16161322

METHOD FOR DETECTING PARTICULATE RADIATION

IPC classification:
G01T 1/24
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The application has been published
EP16166998

THREE-DIMENSIONAL IMAGING IN CHARGED-PARTICLE MICROSCOPY

IPC classification:
G01N 23/22, H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The application has been published
EP16171645

CHARGED-PARTICLE MICROSCOPE WITH IN SITU DEPOSITION FUNCTIONALITY

IPC classification:
C23C 14/35, H01J 37/28, H01J 37/34
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP16187654

ATTACHMENT OF NANO-OBJECTS TO BEAM-DEPOSITED STRUCTURES

IPC classification:
C23F 4/02, C25D 5/02, H01J 37/18, H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The application has been published
EP16173566

CATHODOLUMINESCENCE DETECTOR FOR USE IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The application has been published
EP16705654

METHOD FOR IMAGING A FEATURE USING A SCANNING PROBE MICROSCOPE

IPC classification:
G01Q 60/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP16179172

METHOD OF IMAGING A SPECIMEN USING PTYCHOGRAPHY

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The application has been published
EP17174986

METHOD OF IMAGING A SPECIMEN USING PTYCHOGRAPHY

IPC classification:
H01J 37/22, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
The application has been published

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