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We have observed 141 EP applications Hendrik Bakker has served for within the last five+ years. (We consider all applications which have an EP A1 or A2 publication dated after August 17, 2014). Please note, that we only count EP applications, in which the name of the patent attorney is explicitly mentioned as representative. These EP applications are:

EP13157564

Method of studying a cryogenic sample in an optical microscope

IPC classification:
G02B 27/00, G02B 21/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12852813

HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE THINNING OF CROSS-SECTIONAL VIEW LAMELLA

IPC classification:
H01J 37/26, G01N 1/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13162084

Low energy ion milling or deposition

IPC classification:
H01J 37/317, H01J 37/305, H01J 37/02
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12844105

SAMPLE BLOCK HOLDER

IPC classification:
G01N 23/225, G01N 1/36
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP14165529

Method of using a phase plate in a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP13165356

Method of using a phase plate in a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14169930

Precursor for planar deprocessing of semiconductor devices using a focused ion beam

IPC classification:
H01L 21/3213, H01J 37/305
Applicant:
FEI Company
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP13170553

Method for imaging a sample in a dual-beam charged particle apparatus

IPC classification:
H01J 37/147
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13170871

Method for electron tomography

IPC classification:
G01N 23/04
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13172127

Method of welding a frozen aqueous sample to a microprobe

IPC classification:
H01J 37/20, G02B 21/32, G01N 1/42, G01N 1/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14173606

Plan view sample preparation

IPC classification:
G01N 1/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP13180398

Charged-particle microscope with Raman spectroscopy capability

IPC classification:
H01J 37/28, H01J 37/22, G01N 21/65
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14176646

Magnetic lens for focusing a beam of charged particles

IPC classification:
H01J 37/141, H01J 37/14
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13176980

Magnetic lens for focusing a beam of charged particles

IPC classification:
H01J 37/141, H01J 37/14
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13179026

Use of electrostatic objective lens in an electron microscope

IPC classification:
H01J 37/28, H01J 37/145, H01J 37/12
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14180857

Detaching probe from TEM sample during sample preparation

IPC classification:
H01J 37/305, G01N 1/32
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13180022

Method of using an environmental transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14180858

Circuit probe for charged particle beam system

IPC classification:
H01J 37/305, H01J 37/20, G01R 31/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14180462

Method of using an environmental transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP13793928

PREPARATION OF LAMELLAE FOR TEM VIEWING

IPC classification:
H01J 37/30, H01J 37/08
Applicant:
FEI Company
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP13186632

Preparation of cryogenic sample for charged-particle microscopy

IPC classification:
H01J 37/20, G01N 1/42, G01N 1/31, G01N 1/28, G01N 1/20, F25D 3/11
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP15156053

Method of examining a sample in a charged-particle microscope

IPC classification:
H01J 37/26, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14190566

Integrated lamellae extraction station

IPC classification:
G01N 1/32, G01N 1/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14190567

Differential imaging with pattern recognition for process automation of cross sectioning applications

IPC classification:
H01J 37/305, H01J 37/304
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13808743

Multi Species Ion Source

IPC classification:
H01J 37/22, H01J 37/147, H01J 37/08
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13810227

CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET

IPC classification:
G01N 23/225, G01N 23/203
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
GRANT OF PATENT INTENDED
EP12881505

ENDPOINTING FOR FOCUSED ION BEAM PROCESSING

IPC classification:
H01L 21/265, H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14193565

Phase plate for a transmission electron microscope

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14195296

Charged-particle microscopy with enhanced electron detection

IPC classification:
H01J 37/28, H01J 37/22, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13195289

Charged-particle microscopy with enhanced electron detection

IPC classification:
H01J 37/28, H01J 37/22, G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14195297

Method of producing a freestanding thin film of nano-crystalline graphite

IPC classification:
H01J 37/26, H01J 37/20, C23C 16/26
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13195596

Method of producing a freestanding thin film of nano-crystalline carbon

IPC classification:
H01J 37/26, H01J 37/20, C23C 16/26
Applicant:
Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13826116

AUTOMATED EDS STANDARDS CALIBRATION

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13825971

ENVIRONMENTAL SEM GAS INJECTION SYSTEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13198059

Method of investigating the wavefront of a charged-particle beam

IPC classification:
H01J 37/295
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14152582

Correlative optical and charged particle microscope

IPC classification:
H01J 37/26, H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15152977

Surface delayering with a programmed manipulator

IPC classification:
H01L 21/304, G03F 7/20, G03F 1/72, G03F 1/00, G01N 1/06, B28D 5/04, B26D 3/28
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP13843585

MULTIDIMENSIONAL STRUCTURAL ACCESS

IPC classification:
H01L 21/66
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP13843746

BULK DEPOSITION FOR TILTED MILL PROTECTION

IPC classification:
C23F 4/04, B23K 15/08, B23K 15/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13843083

METHOD AND SYSTEM FOR REDUCING CURTAINING IN CHARGED PARTICLE BEAM SAMPLE PREPARATION

IPC classification:
H01L 21/66
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13844339

HIGH ASPECT RATIO STRUCTURE ANALYSIS

IPC classification:
H01J 37/317, H01J 37/305, G01N 23/00, G01N 1/32, G01B 15/00, B23K 15/08
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13849908

AUTOMATED MINERAL CLASSIFICATION

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15157492

Fabrication of a Lamella for Correlative Atomic-Resolution Tomographic Analyses

IPC classification:
H01J 37/285, G01N 1/36, G01N 1/28
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP14169243

Fabrication of a lamella for correlative atomic-resolution tomographic analyses

IPC classification:
H01J 37/285, G01N 1/36, G01N 1/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15160701

Imaging a sample with multiple beams and multiple detectors

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14161505

Imaging a sample with multiple beams and multiple detectors

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14161519

Imaging a sample with multiple beams and a single detector

IPC classification:
H01J 37/30, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15163360

HIGH CAPACITY TEM GRID

IPC classification:
H01J 37/26, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP14172692

High capacity tem grid

IPC classification:
H01J 37/26, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13869553

PROCESS FOR PERFORMING AUTOMATED MINERALOGY

IPC classification:
G01N 23/225, G01N 23/203
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP13868669

DEPOSITING MATERIAL INTO HIGH ASPECT RATIO STRUCTURES

IPC classification:
H01L 21/205
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP13867985

FIDUCIAL DESIGN FOR TILTED OR GLANCING MILL OPERATIONS WITH A CHARGED PARTICLE BEAM

IPC classification:
H01J 37/317
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14737997

ION IMPLANTATION TO ALTER ETCH RATE

IPC classification:
G01N 23/225, G01N 1/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP14170775

Surface delayering with a programmed manipulator

IPC classification:
H01L 21/304, G01N 1/06, B28D 5/04, B26D 3/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14172871

Mathematical image assembly in a scanning-type microscope

IPC classification:
G02B 21/00, H01J 37/28, H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15172227

MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE

IPC classification:
G02B 21/00, H01J 37/28, H01J 37/22
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP14174903

Computational scanning microscopy with improved resolution

IPC classification:
G02B 21/00, H01J 37/28, H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15174190

COMPUTATIONAL SCANNING MICROSCOPY WITH IMPROVED RESOLUTION

IPC classification:
G02B 21/00, H01J 37/28, H01J 37/22
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP15173248

METHOD AND SYSTEM OF CREATING SYMMETRICAL FIB DEPOSITION

IPC classification:
H01J 37/317, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14173457

Blend modes for mineralogy images

IPC classification:
G01N 23/00, G06T 11/00, G06T 15/50
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14176529

Method of calibrating a scanning transmission charged-particle microscope

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15174497

ELECTROSTATIC LENS TRANSMISSIVE FOR EMISSIONS FROM A SAMPLE

IPC classification:
H01J 37/26, H01J 37/244, H01J 37/12
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP15181994

IMPROVED RADIATION SENSOR, AND ITS APPLICATION IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01L 31/105, H01J 37/244, H01L 27/146
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14182139

Method of acquiring EBSP patterns

IPC classification:
H01J 37/252, G01N 23/203, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14182128

Improved radiation sensor, and its application in a charged-particle microscope

IPC classification:
H01L 31/105, H01J 37/244, H01L 27/146
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14183576

Method of performing spectroscopy in a transmission charged-particle microscope

IPC classification:
H01J 37/26, H01J 37/244, H01J 37/09, H01J 37/05
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15183309

METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/26, H01J 37/244, H01J 37/09, H01J 37/05
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15182001

METHOD OF ACQUIRING EBSP PATTERNS

IPC classification:
G01N 23/225, G01N 23/20, H01J 37/252, G01N 23/203, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION IN PROGRESS
EP15184210

AUTOSLICE AND VIEW UNDERCUT METHOD

IPC classification:
G01N 1/32, G01N 1/28
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP14185799

Improved spectroscopy in a transmission charged-particle microscope

IPC classification:
H01J 37/26, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15150310

CHICANE BLANKER ASSEMBLIES FOR CHARGED PARTICLE BEAM SYSTEMS AND METHODS OF USING THE SAME

IPC classification:
H01J 37/05, H01J 37/04
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14188029

Aligning a featureless thin film in a TEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14187878

Conditioning of a hole-free phase plate in a TEM

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14189135

Charged Particle Microscope with special aperture plate

IPC classification:
H01J 37/28, H01J 37/26, H01J 37/09
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP14190703

Composite scan path in a charged particle microscope

IPC classification:
H01J 37/28, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15192862

AUTOMATED TEM SAMPLE PREPARATION

IPC classification:
G01N 1/28, H01J 37/304
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP15193785

CHARGED PARTICLE MICROSCOPE WITH BAROMETRIC PRESSURE CORRECTION

IPC classification:
H01J 37/26, H01J 37/02
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15193787

CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/244, H01J 37/20
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
GRANT OF PATENT INTENDED
EP14192805

Charged Particle Microscope with barometric pressure correction

IPC classification:
H01J 37/26, H01J 37/02
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14192853

Contactless temperature measurement in a charged particle microscope

IPC classification:
H01J 37/244, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP14197422

Improved cryogenic specimen holder for a charged particle microscope

IPC classification:
H01J 37/20, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15199728

FIDUCIAL-BASED CORRELATIVE MICROSCOPY

IPC classification:
H01J 37/26, G01N 21/64, G02B 21/36
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP14199616

Improved specimen holder for a charged particle microscope

IPC classification:
H01J 37/26, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14200596

Charged Particle Microscope with improved spectroscopic functionality

IPC classification:
G01N 23/225, G01N 23/223
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15150779

Method of modifying a sample surface layer from a microscopic sample

IPC classification:
G01N 1/44, H01J 37/317, H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15150996

Multipole magnetic lens for manipulating a beam of charged particles

IPC classification:
H01J 37/153, H01J 37/14
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16156848

PULSE PROCESSING

IPC classification:
G01T 1/17
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15156716

Pulse processing

IPC classification:
G01T 1/17
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16156892

SAMPLE-SPECIFIC REFERENCE SPECTRA LIBRARY

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP15159339

METHODS AND SYSTEMS FOR MANAGING MULTIPLE VERSIONS OF A PROCESS IN A PROCESSING CHAIN

IPC classification:
G06T 5/00
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP15156546

Preparation of sample for charged-particle microscopy

IPC classification:
G01N 1/42, H01J 37/26, G01N 1/28
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP15156537

Multi-source GIS for particle-optical apparatus

IPC classification:
H01J 37/30
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
PATENT GRANTED
EP15192573

POST COLUMN FILTER WITH ENHANCED ENERGY RANGE

IPC classification:
H01J 37/26, H01J 37/05
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
GRANT OF PATENT INTENDED
EP15159132

PATTERN MATCHING USING A LAMELLA OF KNOWN SHAPE FOR AUTOMATED S/TEM ACQUISITION AND METROLOGY

IPC classification:
H01J 37/26, G06T 1/00, H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15159576

APPARATUS AND METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE

IPC classification:
H04N 5/3745, H01L 31/107, H01L 27/146, H01J 37/244, H01J 37/05, H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15161138

Sample-specific reference spectra library

IPC classification:
G01N 23/225
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16162513

CHARGED PARTICLE BEAM PROCESSING USING PROCESS GAS AND COOLED SURFACE

IPC classification:
H01J 37/18, H01J 37/317, H01J 37/305
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
EXAMINATION REQUESTED
EP16164988

METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGED PARTICLE APPARATUS

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP15163623

METHOD AND SCANNING TRANSMISSION TYPE CHARGED-PARTICLE MICROSCOPE FOR PERFORMING TOMOGRAPHIC IMAGING

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP15163671

METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGED PARTICLE APPARATUS

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
GRANT OF PATENT INTENDED
EP16167122

ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANALYSIS

IPC classification:
H01J 37/28, H01J 37/26
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP16169828

ELECTRON BEAM MICROSCOPE WITH IMPROVED IMAGING GAS AND METHOD OF USE

IPC classification:
H01J 37/244
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP15169668

ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANALYSIS

IPC classification:
H01J 37/26, H01J 61/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16172498

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/305, H01J 37/304, G01N 1/28, H01J 37/26
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15171227

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/305, H01J 37/304, H01J 37/26, G01N 1/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15172752

METHOD OF PTYCHOGRAPHIC IMAGING

IPC classification:
G06T 11/00, G01N 23/04
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP15174195

INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS

IPC classification:
H01J 37/22
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP16177044

ADAPTIVE BEAM CURRENT FOR HIGH THROUGHPUT PATTERNING

IPC classification:
H01J 37/302
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
Request for examination was made
EP15178825

MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL

IPC classification:
H01J 37/20
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP15178757

SCAN PATTERN IN A CHARGED PARTICLE MICROSCOPE COMPRISING NESTED ORBITAL WINDINGS

IPC classification:
H01J 37/28
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15178449

TEM SAMPLE MOUNTING GEOMETRY

IPC classification:
G01N 1/32, H01J 37/20
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP15181202

NOVEL ACQUISITION AND PROCESSING OF DATA IN A TOMOGRAPHIC IMAGING APPARATUS

IPC classification:
G06T 11/00
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP16157199

STUDYING DYNAMIC SPECIMEN BEHAVIOR IN A CHARGED-PARTICLE MICROSCOPE

IPC classification:
H01J 37/147, H01J 37/28, H01J 37/244, H01J 37/04
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP15182129

POSITIONAL ERROR CORRECTION IN A TOMOGRAPHIC IMAGING APPARATUS

IPC classification:
G06T 11/00
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15186664

CHARGED PARTICLE MICROSCOPE WITH IMPROVED SPECTROSCOPIC FUNCTIONALITY

IPC classification:
H01J 37/26, H01J 37/244
Applicant:
UChicago Argonne, LLC
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15188185

ADAPTIVE BEAM CURRENT FOR HIGH THROUGHPUT PATTERNING

IPC classification:
H01J 37/302
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15189500

INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
G01T 1/20, H01J 37/244
Applicant:
FEI Company
Agent:
Hendrik Bakker, FEI Company
Status:
APPLICATION PUBLISHED
EP15192523

CHARGED PARTICLE MICROSCOPE WITH VIBRATION DETECTION/CORRECTION

IPC classification:
H01J 37/26
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
APPLICATION PUBLISHED
EP16196521

METHOD FOR OPTIMIZING CHARGED PARTICLE BEAMS FORMED BY SHAPED APERTURES

IPC classification:
H01J 37/31
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
APPLICATION PUBLISHED
EP16198005

METHOD FOR DETECTING PARTICULATE RADIATION

IPC classification:
G01T 1/24
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP15193784

SYSTEMS AND METHODS FOR IMAGING DEVICE INTERFACES

IPC classification:
H04N 17/00
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
APPLICATION PUBLISHED
EP15800579

METHOD AND APPARATUS FOR SLICE AND VIEW SAMPLE IMAGING

IPC classification:
H01J 37/08, H01J 37/26
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
EXAMINATION REQUESTED
EP15195079

NOVEL X-RAY IMAGING TECHNIQUE

IPC classification:
H01J 35/08, G01N 23/04
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP15196917

FILTER ASSEMBLY FOR DISCRIMINATING SECONDARY AND BACKSCATTERED ELECTRONS IN A NON-TRANSMISSION CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/28, H01J 37/05
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
APPLICATION PUBLISHED
EP16197127

ARRANGEMENT FOR X-RAY TOMOGRAPHY

IPC classification:
H01J 37/00, G21K 7/00, G01N 23/04, G01N 23/225
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP15199462

PREPARATION OF CRYOGENIC SAMPLE FOR CHARGED-PARTICLE MICROSCOPY

IPC classification:
F25D 3/10, A01N 1/02, G01N 1/42
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP17150603

BEAM-INDUCED ETCHING

IPC classification:
H01L 21/3065, H01L 21/306, H01J 37/305
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP16194724

CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/18
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP16152964

HOLDER ASSEMBLY FOR COOPERATING WITH A NANOREACTOR AND AN ELECTRON MICROSCOPE

IPC classification:
H01J 37/20, H01J 37/18
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP16153875

CHARGED-PARTICLE MICROSCOPE WITH ASTIGMATISM COMPENSATION AND ENERGY-SELECTION

IPC classification:
H01J 37/153, H01J 37/05
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP16161322

METHOD FOR DETECTING PARTICULATE RADIATION

IPC classification:
G01T 1/24
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP16166998

THREE-DIMENSIONAL IMAGING IN CHARGED-PARTICLE MICROSCOPY

IPC classification:
G01N 23/22, H01J 37/28, H01J 37/22
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP16171645

CHARGED-PARTICLE MICROSCOPE WITH IN SITU DEPOSITION FUNCTIONALITY

IPC classification:
C23C 14/35, H01J 37/34, H01J 37/28
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP16187654

ATTACHMENT OF NANO-OBJECTS TO BEAM-DEPOSITED STRUCTURES

IPC classification:
H01J 37/30, H01J 37/18, C25D 5/02, C23F 4/02
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP16173566

CATHODOLUMINESCENCE DETECTOR FOR USE IN A CHARGED PARTICLE MICROSCOPE

IPC classification:
H01J 37/22
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The application has been published
EP16705654

METHOD FOR IMAGING A FEATURE USING A SCANNING PROBE MICROSCOPE

IPC classification:
G01Q 60/30
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP16179172

METHOD OF IMAGING A SPECIMEN USING PTYCHOGRAPHY

IPC classification:
H01J 37/28, H01J 37/22
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP17174986

METHOD OF IMAGING A SPECIMEN USING PTYCHOGRAPHY

IPC classification:
H01J 37/28, H01J 37/22
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP17183248

ELECTRON MICROSCOPE WITH MULTIPE TYPES OF INTEGRATED X-RAY DETECTORS ARRANGED IN AN ARRAY

IPC classification:
G01N 23/225, H01J 37/26, H01J 37/244
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
The patent has been granted
EP16184239

MAGNET USED WITH A PLASMA CLEANER

IPC classification:
H01J 37/32, C23C 16/44, H01J 37/26, H01J 37/02
Applicant:
FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Agent:
Multiple attorneys, FEI Company
Status:
Request for examination was made
EP16189519

TOMOGRAPHIC IMAGING METHOD

IPC classification:
H01J 37/28, G06T 11/00, H01J 37/22
Applicant:
FEI Company
Agent:
Multiple attorneys, FEI Company
Agent:
Francis-Paul Janssen, Thermo Fisher Scientific Inc.
Status:
The patent has been granted

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