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Representative before the EPO

Employment test 11 - 50 employees
Company dna denk ip bvba
operating since 2009
980.7
Headquarter in Merelbeke and 3 offices
active in Legal Services, IP Consulting, and IP-related Communication Service

We have observed 18 EP applications Christophe Ego has served for within the last five+ years. (We consider all applications which have an EP A1 or A2 publication dated after November 13, 2013). Please note, that we only count EP applications, in which the name of the patent attorney is explicitly mentioned as representative. These EP applications are:

EP12728042

HIERARCHICAL CARBON NANO AND MICRO STRUCTURES

IPC classification:
C01B 31/02, B81C 1/00
Applicant:
Katholieke Universiteit Leuven
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP12168995

Graphene-based semiconductor device

IPC classification:
H01L 29/16, H01L 29/778
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Christophe Ego, DenK iP bvba
Status:
EXAMINATION IN PROGRESS
EP13156397

Oxygen monolayer on a semiconductor

IPC classification:
H01L 21/316, H01L 21/02
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
EXAMINATION REQUESTED
EP13156019

Conformal anti-reflective coating

IPC classification:
G03F 7/09
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
EXAMINATION REQUESTED
EP13157812

Passivated III-V or Ge fin-shaped field effect transistor

IPC classification:
H01L 29/78, H01L 29/66
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
EXAMINATION REQUESTED
EP13162837

Graphene based field effect transistor

IPC classification:
H01L 29/778, H01L 29/51, H01L 29/16
Applicant:
Katholieke Universiteit Leuven
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
EXAMINATION IN PROGRESS
EP13155745

Semiconductor heterostructure field effect transistor and method for making thereof

IPC classification:
H01L 29/778, H01L 29/205, H01L 29/06, H01L 21/336
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
EXAMINATION REQUESTED
EP13177959

III-V semiconductor device with interfacial layer

IPC classification:
H01L 29/51, H01L 29/20, H01L 21/28
Applicant:
Katholieke Universiteit Leuven
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13169921

Tunnel field effect transistor and method for making thereof

IPC classification:
H01L 29/739, H01L 29/51, H01L 29/205, H01L 29/06
Applicant:
Katholieke Universiteit Leuven
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13184696

Method for transfering a graphene layer

IPC classification:
H01L 21/18
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13184718

Protection of porous substrates before treatment

IPC classification:
H01L 21/768, H01L 21/311, H01L 21/3105
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13186263

Layer deposition on III-V semiconductors

IPC classification:
H01L 21/314, H01L 21/02
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP13188450

Electrical polynucleotide mapping

IPC classification:
G01N 33/487, C12Q 1/68, B01L 3/00
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Christophe Ego, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13197472

Method for activating a porous layer surface

IPC classification:
H01L 21/3105
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Christophe Ego, DenK iP bvba
Status:
GRANT OF PATENT INTENDED
EP14154114

A bilayer graphene tunneling field effect transistor

IPC classification:
H01L 29/786, H01L 29/423
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
Christophe Ego, DenK iP bvba
Status:
The patent has been granted
EP12172125

Method for growing nanostructures in recessed structures

IPC classification:
B82Y 10/00, H01L 51/05, H01L 51/00
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15183574

METALLIZATION METHOD FOR SEMICONDUCTOR STRUCTURES

IPC classification:
H01L 21/768
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Agent:
IMEC VZW
Status:
The patent has been granted
EP17155000

SELF-ALIGNED INTERCONNECTS

IPC classification:
H01L 23/532, H01L 21/768
Applicant:
IMEC VZW
Agent:
Christophe Ego, DenK iP bvba
Agent:
IMEC VZW
Status:
Request for examination was made

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