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André Clerix has worked on the following 63 EPO patent applications which have been published in the last five years:

EP12190865

System and method for the analysis of electrocardiogram signals

IPC classification:
A61B 5/04, A61B 5/0456
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP11191148

Method for bonding semiconductor substrates

IPC classification:
H01L 21/18
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP12173705

METHOD AND SYSTEM FOR HIGH SPEED COMMUNICATION

IPC classification:
H04B 5/00, H04B 7/04, H04B 7/10
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION IN PROGRESS
EP13155546

Circuit and method for digitizing analogue signals

IPC classification:
H03M 1/12
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP12176910

Method for producing a cavity by anisotropically removing material from a substrate

IPC classification:
B81C 1/00, H01L 21/302, H01L 21/306
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12156092

Device, system and method for analogue-to-digital conversion with noise shaping function

IPC classification:
H03M 1/08
Applicant:
IMEC VZW
Applicant:
Renesas Electronics Corporation
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14161687

A two axes MEMS resonant magnetometer

IPC classification:
G01R 33/028
Applicant:
IMEC VZW
Applicant:
King Abdulaziz City for Science and Technology (KACST)
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12181742

Method for self-assembly of substrates and devices obtained thereof

IPC classification:
H01L 21/60, H01L 21/98, H01L 23/485, H01L 25/065
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12182585

DC-DC converter and control method thereof

IPC classification:
H02M 3/158
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
PATENT GRANTED
EP14164272

System and method for the analysis of biopotential signals using motion artifact removal techniques

IPC classification:
A61B 5/00, A61B 5/04
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13163861

Semiconductor device comprising a Schottky diode and a high electron mobility transistor, and manufacturing method thereof

IPC classification:
H01L 21/8252, H01L 27/06, H01L 29/10, H01L 29/20, H01L 29/778, H01L 29/872
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP14166250

2DEG-based sensor and device for ECG sensing

IPC classification:
A61B 5/0408, G01N 27/12, G01N 27/414
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP12187332

Method for producing strained germanium fin structures

IPC classification:
H01L 29/66
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP13168201

III-V device and method for manufacturing thereof

IPC classification:
H01L 21/20
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP13168227

Electric controlled micro-fluidic device

IPC classification:
B01L 3/00, G01N 21/65
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP14168567

Low temperature Ohmic contacts for III-N power devices

IPC classification:
H01L 21/285, H01L 29/20, H01L 29/417, H01L 29/45, H01L 29/778
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP12188867

Schottky diode structure and method of fabrication

IPC classification:
H01L 29/20, H01L 29/778, H01L 29/872
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION IN PROGRESS
EP13169700

Optical stimulation device

IPC classification:
A61N 5/06
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP13171347

Solid state battery with surface ion-diffusion enhancement coating and method for manufacturing thereof.

IPC classification:
H01M 4/04, H01M 10/0525, H01M 10/0562, H01M 10/0565
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP12172788

Method for producing conductive lines in close proximity in the fabrication of micro-electromechanical systems

IPC classification:
B81C 1/00
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13173917

Biopotential signal acquisition system and method

IPC classification:
A61B 5/04, A61B 5/0408, A61B 5/0428, A61B 5/0478, A61B 5/0492, H03F 3/45
Applicant:
IMEC VZW
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
PATENT GRANTED
EP13173335

Method for producing contact areas on a semiconductor substrate

IPC classification:
H01L 21/48, H01L 23/498
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP13173380

Method for forming a strained semiconductor structure

IPC classification:
H01L 21/762
Applicant:
IMEC VZW
Applicant:
Samsung Electronics Co Ltd
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP13173913

Instrumentation amplifier and signal amplification method

IPC classification:
H03F 1/34, H03F 3/45
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12196215

III nitride transistor with source connected heat-spreading plate

IPC classification:
H01L 23/482, H01L 29/66, H01L 29/778
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP12175390

Method for producing a mems device including a vapour release step

IPC classification:
B81C 1/00
Applicant:
IMEC VZW
Applicant:
NXP B.V.
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12176325

Apparatus and method for atomic force microscopy in controlled atmosphere

IPC classification:
B82Y 35/00, G01Q 30/12, G01Q 30/16
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP12173761

Method for producing metal lines on top of a non-flat mems topography

IPC classification:
B81C 1/00
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14150428

Method for patterning a magnetic tunnel junction stack

IPC classification:
H01L 27/22, H01L 43/08, H01L 43/12
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14177200

Device and method for electrochemical gas sensing

IPC classification:
G01N 27/404
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP12197425

Method for bonding semiconductor substrates and devices obtained thereby

IPC classification:
H01L 21/60, H01L 23/00
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP14172997

Carrier-depletion based silicon waveguide resonant cavity modulator with integrated optical power monitor

IPC classification:
G02B 6/12, G02F 1/025, G02F 1/313
Applicant:
IMEC VZW
Applicant:
Ghent University (Universiteit Gent)
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP13196844

Vertical electromechanical switch device and method for manufacturing the same.

IPC classification:
H01H 1/00, H01H 59/00
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
André Clerix, IMEC VZW
Status:
PATENT GRANTED
EP12198099

Device and method for calculating cardiorespiratory fitness level and energy expenditure of a living being

IPC classification:
A61B 5/11, A61B 5/22, A63B 24/00
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP13181803

A method for dopant implantation of FinFET structures

IPC classification:
H01L 21/8234, H01L 21/8238
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14180263

Device and method for automatically normalizing the physiological signals of a living being

IPC classification:
A61B 5/11, A61B 5/22, A63B 24/00, G06F 19/00
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP13185659

Method for the extraction of recombination characteristics at metallized semiconductor surfaces

IPC classification:
G01N 21/64, G01R 31/26, H01L 21/66
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP14152595

Probe configuration and method of fabrication thereof

IPC classification:
G01Q 70/14, G01Q 70/16
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP14189000

Episubstrates for selective area growth of group iii-v material and a method for fabricating a group iii-v material on a silicon substrate

IPC classification:
H01L 21/02
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP13195066

Capillary flow plasmonic sensor

IPC classification:
B01L 3/00, G01N 21/55, G01N 21/65
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION IN PROGRESS
EP13195075

Device and method for performing digital PCR

IPC classification:
B01L 3/00, B01L 7/00
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP13197379

Memory control system for a non-volatile memory and control method

IPC classification:
G06F 1/32, G06F 13/16
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP14191906

FPGA device with programmable interconnect in back end of line portion of the device.

IPC classification:
G11C 11/406, H01L 21/66, H01L 23/544, H03K 19/177
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP14198450

INTEGRATED PHOTONIC WAVEGUIDE GRATING COUPLER

IPC classification:
G02B 6/12, G02B 6/124
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP14150456

Three-dimensional resistive memory array

IPC classification:
H01L 27/24, H01L 45/00
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
PATENT GRANTED
EP14152599

Magnetic multilayer stack

IPC classification:
G11C 11/16, H01F 10/32, H01L 43/08, H01L 43/10
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15151213

Implantable SERS sensing device and method to fabricate

IPC classification:
G01N 21/552, G01N 21/65
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Applicant:
Panasonic Corporation
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14151290

Microstructured micropillar arrays for controllable filling of a capillary pump

IPC classification:
B01L 3/00
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
The patent has been granted
EP15151578

A modulation circuit for a radio device and a method thereof

IPC classification:
H03D 7/14, H03D 7/16
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
The patent has been granted
EP14154192

System and method for acquisition of biopotential signals with motion artifact reduction in real time operation

IPC classification:
A61B 5/00, A61B 5/04, A61B 5/0402
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
PATENT GRANTED
EP14178858

System for direct conversion receivers

IPC classification:
H03J 1/00, H04B 1/00, H04B 1/30
Applicant:
Stichting IMEC Nederland
Agent:
André Clerix, IMEC VZW
Status:
GRANT OF PATENT INTENDED
EP15160738

Method for manufacturing a semiconductor-on-insulator device

IPC classification:
H01L 21/762
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP15160743

METHOD FOR MANUFACTURING A III-V GATE ALL AROUND SEMICONDUCTOR DEVICE

IPC classification:
B82Y 10/00, B82Y 40/00, H01L 29/06, H01L 29/10, H01L 29/20, H01L 29/66, H01L 29/775
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
PATENT GRANTED
EP15163524

METHOD FOR FORMING CHALCOGENIDE LAYERS

IPC classification:
H01L 21/36, H01L 31/18
Applicant:
Hasselt University (Universiteit Hasselt)
Applicant:
IMEC VZW
Applicant:
King Abdulaziz City for Science and Technology (KACST)
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION IN PROGRESS
EP14169499

Method of Producing a III-V Fin Structure

IPC classification:
H01L 21/02, H01L 29/66, H01L 29/78
Applicant:
IMEC VZW
Applicant:
Sony Corporation
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP14174985

Active pixel sensor imaging system

IPC classification:
H03F 3/50
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP15176745

DUAL CHANNEL FINFET CMOS DEVICE WITH COMMON STRAIN-RELAXED BUFFER AND METHOD FOR MANUFACTURING THEREOF

IPC classification:
H01L 21/8238, H01L 27/092, H01L 29/78
Applicant:
IMEC VZW
Applicant:
Samsung Electronics Co Ltd
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP14178482

Microfluidic device and method of manufacturing thereof

IPC classification:
B01L 3/00, B01L 9/00, F04B 19/00, F04B 43/00, G01N 21/00, H01L 21/00
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP15176815

METHOD FOR SELECTIVE OXIDE REMOVAL

IPC classification:
H01L 21/311, H01L 21/768
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP14183484

Method for fabricating crystalline photovoltaic cells

IPC classification:
H01L 31/0216, H01L 31/068
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION IN PROGRESS
EP12191680

Biomedical acquisition system with motion artifact reduction

IPC classification:
A61B 5/00, A61B 5/04, A61B 5/053, H01L 27/08, H03F 1/56, H03F 3/45
Applicant:
IMEC VZW
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12156093

Device, system and method for analogue-to-digital conversion using a current integrating circuit

IPC classification:
G11C 27/02, H03M 1/08, H03M 1/12
Applicant:
IMEC VZW
Applicant:
Renesas Electronics Corporation
Agent:
André Clerix, IMEC VZW
Status:
EXAMINATION REQUESTED
EP13152000

Method for fabricating a dual work function semiconductor device

IPC classification:
H01L 21/8234, H01L 21/8238
Applicant:
IMEC VZW
Applicant:
Katholieke Universiteit Leuven
Agent:
André Clerix, IMEC VZW
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT

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