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Alexander Waldauf has worked on the following 21 EPO patent applications which have been published in the last five years:

EP11754274

METHOD AND ARRANGEMENT FOR DETECTING BIOLOGICAL AND/OR CHEMICAL SUBSTANCES

IPC classification:
G01N 21/77
Applicant:
Jenoptik Polymer Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION IN PROGRESS
EP11748907

FIXING AN OPTICS HOLDER, WHICH CAN BE ADJUSTED IN TWO DIRECTIONS IN SPACE, WITH AN ADHESIVE THAT SHRINKS

IPC classification:
H01S 3/02, H01S 3/06, H01S 3/081, H01S 3/086
Applicant:
Jenoptik Laser GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
GRANT OF PATENT INTENDED
EP11760751

ARRANGEMENT AND METHOD FOR GENERATING A LIGHT BEAM FOR MATERIAL PROCESSING

IPC classification:
B23K 26/06, B23K 26/067, B23K 26/073, G02B 5/18, G02B 27/09
Applicant:
Jenoptik Optical Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
GRANT OF PATENT INTENDED
EP11764711

LASER MODULE HAVING A LASER DIODE UNIT AND HAVING A COOLING MEANS, AND ALSO PRODUCTION METHOD FOR A LASER MODULE OF THIS KIND

IPC classification:
H01S 5/022, H01S 5/024
Applicant:
Jenoptik Laser GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
GRANT OF PATENT INTENDED
EP12746000

METHOD AND ARRANGEMENT FOR COMPARATIVE IMAGING IN OPHTHALMOLOGICAL DEVICES

IPC classification:
A61B 3/12, A61B 3/14
Applicant:
Jenoptik Optical Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION IN PROGRESS
EP14000328

Method of and device for the disposal of a slug that is formed during the process of perforating a hollow profile

IPC classification:
B21D 28/24, B21D 28/28, B21D 43/28, B23K 7/00, B23K 26/00, B23K 26/16, B23K 26/38, B23Q 11/00, B26F 1/00, B26F 1/02
Applicant:
Jenoptik Automatisierungstechnik GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
NO OPPOSITION FILED WITHIN TIMELIMIT
EP12798597

ADDITIVE FOR STABILISING SILICON PARTICLES IN AQUEOUS MEDIA

IPC classification:
C09C 1/28
Agent:
Alexander Waldauf, Jenoptik AG
Status:
GRANT OF PATENT INTENDED
EP13706156

INDEPENDENTLY ADJUSTABLE MOUNT ASSEMBLY FOR TWO OPTICAL COMPONENTS

IPC classification:
G02B 7/00, G02B 7/02
Applicant:
Jenoptik Optical Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
PATENT GRANTED
EP14003603

Heat control device and compound control cycle for an aircraft and method for operating a heat control device

IPC classification:
B64D 15/12, H05B 1/02
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION REQUESTED
EP14003812

Method for measuring the speed of a motor vehicle moving along a road

IPC classification:
G01S 13/92
Applicant:
Jenoptik Robot GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION REQUESTED
EP14004270

Method for aligning a laser scanner to a path

IPC classification:
G01S 7/497, G01S 7/51, G01S 17/02, G01S 17/42, G01S 17/58, G01S 17/88
Applicant:
Jenoptik Robot GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
PATENT GRANTED
EP13762064

MEASURING MODULE FOR REMISSION PHOTOMETRIC ANALYSIS AND METHOD FOR THE PRODUCTION THEREOF

IPC classification:
G01N 21/31, G01N 21/47, G02B 1/04, G02B 5/20, G02B 5/28, H01L 25/075, H01L 31/0216, H01L 31/0232
Applicant:
F. Hoffmann-La Roche AG
Applicant:
Roche Diagnostics GmbH
Applicant:
Jenoptik Polymer Systems GmbH
Applicant:
Roche Diabetes Care GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
GRANT OF PATENT INTENDED
EP13814828

METHOD FOR PRODUCING A WAVEFRONT-CORRECTED OPTICAL ARRANGEMENT COMPRISING AT LEAST TWO OPTICAL ELEMENTS

IPC classification:
G02B 27/00
Applicant:
Jenoptik Optical Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
GRANT OF PATENT INTENDED
EP15001439

DEVICE FOR GENERATING A LIGHT INTENSITY DISTRIBUTION

IPC classification:
G02B 27/09
Applicant:
Jenoptik Optical Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
APPLICATION DEEMED TO BE WITHDRAWN
EP14701913

SYSTEM FOR DETERMINING THE POSITION OF A TEST OBJECT AND ASSOCIATED METHOD

IPC classification:
G01B 11/00, G01B 11/02, G01B 11/26, G01M 11/02, G02B 27/30, G02B 27/62
Applicant:
Jenoptik Optical Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
PATENT GRANTED
EP15002437

METHOD AND DEVICE FOR CONTROLLING WING HEATING DEVICES OF AN AIRCRAFT

IPC classification:
B64D 15/12, H05B 1/02
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION REQUESTED
EP11705206

METHOD FOR APPLYING SOFT SOLDER TO A MOUNTING SURFACE OF A COMPONENT

IPC classification:
B23K 1/20, B23K 3/06, B23K 35/02
Applicant:
Jenoptik Laser GmbH
Agent:
Geyer Fehners & Partner mbB
Agent:
Alexander Waldauf, Jenoptik AG
Status:
APPLICATION WITHDRAWN
EP14790516

METHOD AND APPARATUS FOR DETECTING AND CORRECTING A SPATIAL POSITION OF A WORKPIECE HELD IN A POSITIONING DEVICE

IPC classification:
B23Q 15/22, B23Q 17/22, G05B 19/401
Applicant:
Jenoptik Automatisierungstechnik GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION REQUESTED
EP14811771

POLARIZATION SYSTEM

IPC classification:
G02B 5/30
Applicant:
Jenoptik Optical Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION REQUESTED
EP15737977

METHOD FOR PRODUCING AN OPTICAL ELEMENT COMPRISING MICRO-OPTICAL STRUCTURES, ARRANGEMENT AND MEMBRANE UNIT

IPC classification:
B81C 3/00, H01L 21/20
Applicant:
Jenoptik Optical Systems GmbH
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION REQUESTED
EP15753898

METHOD AND AXLE-COUNTING DEVICE FOR CONTACT-FREE AXLE COUNTING OF A VEHICLE AND AXLE-COUNTING SYSTEM FOR ROAD TRAFFIC

IPC classification:
G06T 7/00, G07B 15/00, G08G 1/015, G08G 1/017, G08G 1/04, G08G 1/056
Agent:
Alexander Waldauf, Jenoptik AG
Status:
EXAMINATION REQUESTED

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