Priority Date: 09.07.15 (NL 20152015125)

DEVICE AND METHOD FOR SIMULTANEOUS X-RAY AND GAMMA PHOTON IMAGING WITH A STACKED DETECTOR

  • Application ID: EP16745537
  • Status: Request for examination was made

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Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). Philips International B.V. is specialized in G01. Philips International B.V. is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 09.07.2015 - Priority Date (NL 20152015125)
  • 12.01.2017 - Publication A1 (WO2017007326)
  • 16.05.2018 - Publication A1 (EP3320372)

IPC Classification