DEVICE AND METHOD FOR SIMULTANEOUS X-RAY AND GAMMA PHOTON IMAGING WITH A STACKED DETECTOR
- Application ID: EP16745537
- Status: █ Request for examination was made
This EP application has the IPC class G01 (MEASURING; TESTING). Philips International B.V. is specialized in G01. Philips International B.V. is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.
- 09.07.2015 - Priority Date (NL 20152015125)
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