SPAD ARRAY WITH PIXEL-LEVEL BIAS CONTROL
- Application ID: EP16201123
- Status: █ EXAMINATION REQUESTED
This EP application has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS). We found, that TransMIT GmbH, Kailuweit & Uhlemann, Müller Hoffmann & Partner, Oehmke & Kollegen, Weidner Stern Jeschke and 129 others are specialized in this combination either. For a similar patent, they might be a good choice.