Priority Date: 24.02.14 (EP 20140156356)

Method of examining a sample in a charged-particle microscope

  • Application ID: EP15156053
  • Status: PATENT GRANTED

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Specialization

This patent has the IPC class H01 (BASIC ELECTRIC ELEMENTS) is specialized in H01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 24.02.2014 - Priority Date (EP 20140156356)
  • 29.04.2015 - Publication A1 (EP2866245)
  • 02.11.2016 - Publication B1 (EP2866245)

IPC Classification