Priority Date: 30.08.13 (DE 201310109481)

LASER MICRODISSECTION SYSTEM AND LASER MICRODISSECTION SYSTEM METHOD

  • Application ID: EP14753071
  • Status: GRANT OF PATENT INTENDED

Applicant

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Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). Leica Microsystems GmbH is specialized in G01. Leica Microsystems GmbH is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 30.08.2013 - Priority Date (DE 201310109481)
  • 05.03.2015 - Publication A1 (WO2015028356)
  • 06.07.2016 - Publication A1 (EP3039399)

IPC Classification