Semiconductor test device and semiconductor test method
- Application ID: EP14275032
- Status: █ APPLICATION DEEMED TO BE WITHDRAWN
This EP application has the IPC combination G01 (MEASURING; TESTING) and G06 (COMPUTING; CALCULATING; COUNTING). We found, that Coller IP Management Ltd, Dr. Emil Benatov & Partners - Bulgarian Patent Attorney & Licensed Appraiser, Schweiger & Partners, Marks & Clerk, Kilburn & Strode LLP and 97 others are specialized in this combination either. For a similar patent, they might be a good choice.