Priority Date: 17.12.13 (JP 20130260560)

Semiconductor integrated circuit for calculating the temperature of an object

  • Application ID: EP14197447
  • Status: EXAMINATION REQUESTED

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 17.12.2013 - Priority Date (JP 20130260560)
  • 24.06.2015 - Publication A1 (EP2887034)

IPC Classification