Priority Date: 13.01.09 (SG 20090000229)

System and method for inspecting a wafer

  • Application ID: EP14197439
  • Status: EXAMINATION REQUESTED

Attorneys

Employment test 11 - 50 employees
Company dna puschmann borchert bardehle
operating since 1968
Headquarter in Oberhaching and 1 office
active in Legal Services
Company dna horn kleimann waitzhofer
no operation time available
Headquarter in München
active in Legal Services

Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). Puschmann Borchert Bardehle Patentanwälte Partnerschaft mbB and Horn Kleimann Waitzhofer Patentanwälte PartG mbB are specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 13.01.2009 - Priority Date (SG 20090000229)
  • 18.03.2015 - Publication A1 (EP2848923)

IPC Classification