System and method for inspecting a wafer
- Application ID: EP14197439
- Status: █ EXAMINATION REQUESTED
This EP application has the IPC class G01 (MEASURING; TESTING). Puschmann Borchert Bardehle Patentanwälte Partnerschaft mbB is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.
- 13.01.2009 - Priority Date (SG 20090000229)
- 18.03.2015 - Publication A1 (EP2848923)