Priority Date: 13.01.09 (SG 20090000229)

System and method for inspecting a wafer

  • Application ID: EP14197439
  • Status: EXAMINATION REQUESTED

Attorneys

Employment test 11 - 50 employees
Company dna puschmann borchert bardehle
operating since 1968
Headquarter in Oberhaching and 1 office
active in Legal Services
Company dna horn kleimann waitzhofer
no operation time available
Headquarter in München
active in Legal Services

Specialization

This patent has the IPC class G01 (MEASURING; TESTING) Puschmann Borchert Bardehle Patentanwälte Partnerschaft mbB and Horn Kleimann Waitzhofer Patentanwälte PartG mbB are specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 13.01.2009 - Priority Date (SG 20090000229)
  • 18.03.2015 - Publication A1 (EP2848923)

IPC Classification