Priority Date: 19.12.13 (US 201314134531)

Cmos integrated method for the fabrication of thermopile pixel with umbrella absorber on semiconductor substrate

  • Application ID: EP14196780
  • Status: APPLICATION DEEMED TO BE WITHDRAWN

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 19.12.2013 - Priority Date (US 201314134531)
  • 24.06.2015 - Publication A1 (EP2887032)

IPC Classification