Priority Date: 04.12.13 (EP 20130195678)

Method to pattern substrates

  • Application ID: EP14196320
  • Status: GRANT OF PATENT INTENDED

Applicant

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Technology Company

Attorney

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 117 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 04.12.2013 - Priority Date (EP 20130195678)
  • 10.06.2015 - Publication A2 (EP2881977)
  • 14.10.2015 - Publication A3 (EP2881977)

IPC Classification