Priority Date: 20.12.13 (DE 201310114687)

Method and device for three dimensional optical measurement of objects with a topometric measuring method and computer programme for same

  • Application ID: EP14195437
  • Status: GRANT OF PATENT INTENDED

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Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 20.12.2013 - Priority Date (DE 201310114687)
  • 24.06.2015 - Publication A1 (EP2887010)

IPC Classification