Priority Date: 02.12.13 (EP 20130195289)

Charged-particle microscopy with enhanced electron detection

  • Application ID: EP14195296
  • Status: NO OPPOSITION FILED WITHIN TIMELIMIT

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 120 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 02.12.2013 - Priority Date (EP 20130195289)
  • 03.06.2015 - Publication A1 (EP2879157)
  • 13.01.2016 - Publication B1 (EP2879157)

IPC Classification