Priority Date: 18.10.13 (JP 20130217508)

Semiconductor device and electronic control device

  • Application ID: EP14188457
  • Status: GRANT OF PATENT INTENDED

Applicant

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H03 (BASIC ELECTRONIC CIRCUITRY) is specialized in the combination G01 and H03. We found, that Gevers, P&TS AG, Patentanwaltkanzlei von B├╝low & Tamada, 24IP Law Group Sonnenberg Fortmann, Westphal Mussgnug & Partner and 24 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 18.10.2013 - Priority Date (JP 20130217508)
  • 22.04.2015 - Publication A2 (EP2863546)
  • 06.05.2015 - Publication A3 (EP2863546)

IPC Classification