X-ray testing device for material testing and method for the generation of high-resolution projections of a test object by means of x-ray beams
- Application ID: EP14177760
- Status: █ APPLICATION DEEMED TO BE WITHDRAWN
This patent has the IPC combination G01, H01, and H05 is specialized in the combination G01, H01, and H05. We found, that Jakelski & Althoff Patentanwälte PartG mbB, Blumbach Zinngrebe Patent-und Rechtsanwälte GbR patentConsult, Cremer & Cremer, Durm & Partner, Strehl Schübel-Hopf & Partner and 17 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.