X-ray testing device for material testing and method for the generation of high-resolution projections of a test object by means of x-ray beams
- Application ID: EP14177760
- Status: █ APPLICATION DEEMED TO BE WITHDRAWN
This EP application has the IPC combination G01, H01, and H05. We found, that Jakelski & Althoff Patentanwälte PartG mbB, Cremer & Cremer, Durm & Partner, METIDA Law Firm of Reda Zaboliene, Rösler Rasch van der Heide & Partner and 14 others are specialized in this combination either. For a similar patent, they might be a good choice.