Priority Date: 19.07.13 (DE 201310107736)

X-ray testing device for material testing and method for the generation of high-resolution projections of a test object by means of x-ray beams

  • Application ID: EP14177760
  • Status: APPLICATION DEEMED TO BE WITHDRAWN

Applicant

Attorney

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2 offices
Technology Company

Specialization

This patent has the IPC combination G01, H01, and H05 is specialized in the combination G01, H01, and H05. We found, that Jakelski & Althoff Patentanwälte PartG mbB, Blumbach Zinngrebe Patent-und Rechtsanwälte GbR patentConsult, Cremer & Cremer, Durm & Partner, Strehl Schübel-Hopf & Partner and 15 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 19.07.2013 - Priority Date (DE 201310107736)
  • 21.01.2015 - Publication A1 (EP2827135)

IPC Classification