Priority Date: 10.07.13 (JP 20130144127)

Photo device inspection apparatus and photo device inspection method

  • Application ID: EP14176178
  • Status: EXAMINATION IN PROGRESS

Applicants

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Employment test 1 - 10 employees
Company dna kilian kilian and partner
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Headquarter in Munich and 1 office
active in Legal Services

Specialization

This patent has the IPC class G01 (MEASURING; TESTING) Kilian, Kilian & Partner is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 10.07.2013 - Priority Date (JP 20130144127)
  • 14.01.2015 - Publication A2 (EP2824469)
  • 22.07.2015 - Publication A3 (EP2824469)

IPC Classification