Priority Date: 10.07.13 (JP 20130144127)

Photo device inspection apparatus and photo device inspection method

  • Application ID: EP14176178
  • Status: The patent has been granted


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Technology Company
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Research Organisation


Employment test 1 - 10 employees
Company dna kilian kilian and partner
no operation time available
Headquarter in Munich and 1 office
active in Legal Services


This EP application has the IPC class G01 (MEASURING; TESTING). Kilian, Kilian & Partner is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.


  • 10.07.2013 - Priority Date (JP 20130144127)
  • 14.01.2015 - Publication A2 (EP2824469)
  • 22.07.2015 - Publication A3 (EP2824469)
  • 27.12.2017 - Publication B1 (EP2824469)

IPC Classification