Methods and devices for high throughput crystal structure analysis by electron diffraction
- Application ID: EP14176023
- Status: █ GRANT OF PATENT INTENDED
This EP application has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS). We found, that TransMIT GmbH, Kailuweit & Uhlemann, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 121 others are specialized in this combination either. For a similar patent, they might be a good choice.