Priority Date: 06.11.08 (EP 20080168475)

Methods and devices for high throughput crystal structure analysis by electron diffraction

  • Application ID: EP14176023
  • Status: GRANT OF PATENT INTENDED

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 117 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 06.11.2008 - Priority Date (EP 20080168475)
  • 31.12.2014 - Publication A1 (EP2818852)

IPC Classification