Priority Date: 05.03.13 (EP 20130157864)

An X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus

  • Application ID: EP14157972
  • Status: GRANT OF PATENT INTENDED

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 05.03.2013 - Priority Date (EP 20130157864)
  • 10.09.2014 - Publication A1 (EP2775296)

IPC Classification