Automated nital etch inspection system
- Application ID: EP14152499
- Status: █ NO OPPOSITION FILED WITHIN TIMELIMIT
This EP application has the IPC class G01 (MEASURING; TESTING). Barker Brettell LLP is specialized in G01. Barker Brettell LLP is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.
- 03.01.2014 - Priority Date (US 201414147195)
- 08.07.2015 - Publication A1 (EP2891879)
- 11.05.2016 - Publication B1 (EP2891879)