Method and data analysis system for semi-automated particle analysis using a charged particle beam
- Application ID: EP14004439
- Status: █ PATENT GRANTED
This EP application has the IPC class G06 (COMPUTING; CALCULATING; COUNTING) and H01 (BASIC ELECTRIC ELEMENTS). We found, that Grünecker Patent- und Rechtsanwälte PartG mbB, Boehmert & Boehmert Anwaltspartnerschaft mbB, Marks & Clerk, IP Asset LLP, Santarelli and 61 others are specialized in this combination either. For a similar patent, they might be a good choice.