Priority Date: 05.11.13 (DE 20131018547)

Method and device for alignment of an optical imaging system

  • Application ID: EP14003721
  • Status: EXAMINATION REQUESTED

Applicant

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 05.11.2013 - Priority Date (DE 20131018547)
  • 06.05.2015 - Publication A1 (EP2869022)

IPC Classification