Priority Date: 21.08.12 (US 201261691642P)

PRIMARY AND SECONDARY SCANNING IN MUON TOMOGRAPHY INSPECTION

  • Application ID: EP13842125
  • Status: The patent has been granted

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Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). AWA is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 21.08.2012 - Priority Date (US 201261691642P)
  • 03.04.2014 - Publication A2 (WO2014051895)
  • 01.07.2015 - Publication A2 (EP2888579)
  • 27.09.2017 - Publication B1 (EP2888579)

IPC Classification