Priority Date: 14.09.12 (US 201213618760)

DUAL-LENS-GUN ELECTRON BEAM APPARATUS AND METHODS FOR HIGH-RESOLUTION IMAGING WITH BOTH HIGH AND LOW BEAM CURRENTS

  • Application ID: EP13837241
  • Status: GRANT OF PATENT INTENDED

Applicant

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Technology Company

Attorney

operating since 1927
Headquarter in Dublin and 1 office
active in Legal Services

Specialization

This EP application has the IPC class H01 (BASIC ELECTRIC ELEMENTS). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 14.09.2012 - Priority Date (US 201213618760)
  • 20.03.2014 - Publication A1 (WO2014043557)
  • 22.07.2015 - Publication A1 (EP2896062)

IPC Classification