Priority Date: 01.08.12 (US 201261678576P)

INSPECTING A WAFER AND/OR PREDICTING ONE OR MORE CHARACTERISTICS OF A DEVICE BEING FORMED ON A WAFER

  • Application ID: EP13825507
  • Status: APPLICATION WITHDRAWN

Applicant

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Technology Company

Attorney

operating since 1927
Headquarter in Dublin and 1 office
active in Legal Services

Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) F. R. Kelly & Co. is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 116 others are specialized in all of these IPC classes as well. For a similar patent, they might be a good choice.

Timeline

  • 01.08.2012 - Priority Date (US 201261678576P)
  • 06.02.2014 - Publication A1 (WO2014022682)
  • 10.06.2015 - Publication A1 (EP2880427)

IPC Classification