INSPECTING A WAFER AND/OR PREDICTING ONE OR MORE CHARACTERISTICS OF A DEVICE BEING FORMED ON A WAFER
- Application ID: EP13825507
- Status: █ APPLICATION WITHDRAWN
This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) F. R. Kelly & Co. is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Kailuweit & Uhlemann, Müller Hoffmann & Partner, Patentanwälte Rauschenbach and 117 others are specialized in all of these IPC classes as well. For a similar patent, they might be a good choice.