Priority Date: 23.07.12 (JP 20120162925)

SAMPLE HOLDER AND METHOD FOR OBSERVING ELECTRON MICROSCOPIC IMAGE

  • Application ID: EP13823532
  • Status: GRANT OF PATENT INTENDED

Attorney

no operation time available
1045.85
4 offices
active in Legal Services

Specialization

This patent has the IPC class H01 (BASIC ELECTRIC ELEMENTS) is specialized in H01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 23.07.2012 - Priority Date (JP 20120162925)
  • 30.01.2014 - Publication A1 (WO2014017008)
  • 27.05.2015 - Publication A1 (EP2876665)

IPC Classification