Priority Date: 13.03.12 (JP 20120056450)

ANTENNA INSPECTION SYSTEM, ANTENNA INSPECTION APPARATUS, ANTENNA INSPECTION METHOD, AND PROGRAM

  • Application ID: EP13761991
  • Status: GRANT OF PATENT INTENDED

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Kailuweit & Uhlemann, Müller Hoffmann & Partner, Patentanwälte Rauschenbach and 115 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 13.03.2012 - Priority Date (JP 20120056450)
  • 19.09.2013 - Publication A1 (WO2013137126)
  • 21.01.2015 - Publication A1 (EP2827122)

IPC Classification