Priority Date: 06.09.12 (DE 20121017871)

DIFFERENTIAL SENSOR, INSPECTION SYSTEM AND METHOD FOR THE DETECTION OF ANOMALIES IN ELECTRICALLY CONDUCTIVE MATERIALS

  • Application ID: EP13756496
  • Status: GRANT OF PATENT INTENDED

Attorney

Employment test 11 - 50 employees
Company dna ruff wilhelm beier dauster
operating since 2001
Headquarter in Stuttgart
active in Legal Services and IP Consulting

Specialization

This patent has the IPC class G01 (MEASURING; TESTING) Patentanwälte Ruff, Wilhelm, Beier, Dauster & Partner mbB is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 06.09.2012 - Priority Date (DE 20121017871)
  • 13.03.2014 - Publication A1 (WO2014037388)
  • 15.07.2015 - Publication A1 (EP2893336)

IPC Classification