Priority Date: 02.08.12 (FR 20120057556)

METHOD FOR ANALYSING THE CRYSTAL STRUCTURE OF A POLYCRYSTALLINE SEMICONDUCTOR

  • Application ID: EP13750857
  • Status: GRANT OF PATENT INTENDED

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 02.08.2012 - Priority Date (FR 20120057556)
  • 06.02.2014 - Publication A1 (WO2014020046)
  • 10.06.2015 - Publication A1 (EP2880426)

IPC Classification