MICROCRYSTAL STRUCTURE ANALYSIS DEVICE, MICROCRYSTAL STRUCTURE ANALYSIS METHOD, AND X-RAY SHIELD DEVICE
- Application ID: EP13747037
- Status: █ GRANT OF PATENT INTENDED
This EP application has the IPC class G01 (MEASURING; TESTING). De Clercq & Partners cvba is specialized in G01. De Clercq & Partners cvba is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.
- 06.02.2012 - Priority Date (JP 20120023212)
- 15.08.2013 - Publication A1 (WO2013118761)
- 17.12.2014 - Publication A1 (EP2813842)