Priority Date: 06.02.12 (JP 20120023212)

MICROCRYSTAL STRUCTURE ANALYSIS DEVICE, MICROCRYSTAL STRUCTURE ANALYSIS METHOD, AND X-RAY SHIELD DEVICE

  • Application ID: EP13747037
  • Status: GRANT OF PATENT INTENDED

Applicant

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) De Clercq & Partners cvba is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 06.02.2012 - Priority Date (JP 20120023212)
  • 15.08.2013 - Publication A1 (WO2013118761)
  • 17.12.2014 - Publication A1 (EP2813842)

IPC Classification