Priority Date: 27.07.12 (US 201261676368P)

ION BEAM SAMPLE PREPARATION APPARATUS AND METHODS

  • Application ID: EP13745536
  • Status: EXAMINATION IN PROGRESS

Attorneys

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 117 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 27.07.2012 - Priority Date (US 201261676368P)
  • 30.01.2014 - Publication A2 (WO2014018694)
  • 03.06.2015 - Publication A2 (EP2878008)

IPC Classification