Priority Date: 10.07.12 (FR 20120056629)

METHOD FOR CHARACTERISING AN OBJECT COMPRISING, AT LEAST LOCALLY, A PLANE OF SYMMETRY

  • Application ID: EP13744674
  • Status: GRANT OF PATENT INTENDED

Applicant

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Technology Company

Attorney

operating since 1930
Headquarter in Paris, Düsseldorf and 6 offices
active in Legal Services, IP Consulting, and IP Portfolio Processing

Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 10.07.2012 - Priority Date (FR 20120056629)
  • 16.01.2014 - Publication A1 (WO2014009632)
  • 20.05.2015 - Publication A1 (EP2872883)

IPC Classification