Priority Date: 19.01.12 (US 201261588561P)

METHOD AND APPARATUS FOR MEASURING SHAPE AND THICKNESS VARIATION OF A WAFER

  • Application ID: EP13738353
  • Status: APPLICATION WITHDRAWN

Applicant

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Technology Company

Attorney

operating since 1927
Headquarter in Dublin and 1 office
active in Legal Services

Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). F. R. Kelly & Co. is specialized in G01. F. R. Kelly & Co. is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 19.01.2012 - Priority Date (US 201261588561P)
  • 25.07.2013 - Publication A1 (WO2013109733)
  • 03.12.2014 - Publication A1 (EP2807451)

IPC Classification