Priority Date: 11.06.12 (FI 20120005637)

APPARATUS AND METHOD FOR MEASURING OPTICAL COMPONENT

  • Application ID: EP13734817
  • Status: GRANT OF PATENT INTENDED

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 11.06.2012 - Priority Date (FI 20120005637)
  • 19.12.2013 - Publication A1 (WO2013186435)
  • 15.04.2015 - Publication A1 (EP2859328)

IPC Classification