Priority Date: 04.01.12 (US 201261583074P)

SYSTEM AND METHOD FOR MEASURING NARROW AND WIDE ANGLE LIGHT SCATTER ON A CELL SORTING DEVICE

  • Application ID: EP13733886
  • Status: GRANT OF PATENT INTENDED

Applicants

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Technology Company
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Technology Company

Attorney

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 04.01.2012 - Priority Date (US 201261583074P)
  • 11.07.2013 - Publication A1 (WO2013103819)
  • 08.10.2014 - Publication A1 (EP2786118)

IPC Classification