Priority Date: 09.03.12 (EP 20120290084)

METHOD AND TOOL FOR MEASURING THE GEOMETRIC STRUCTURE OF AN OPTICAL COMPONENT

  • Application ID: EP13708795
  • Status: GRANT OF PATENT INTENDED

Applicant

Technology company logo small
Technology Company

Attorney

no operation time available
1 office
Technology Company

Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 09.03.2012 - Priority Date (EP 20120290084)
  • 12.09.2013 - Publication A1 (WO2013132072)
  • 14.01.2015 - Publication A1 (EP2823279)

IPC Classification