Method and device for analyzing trace data generated by an optical time domain reflectometer

  • Application ID: EP13305685
  • Status: GRANT OF PATENT INTENDED

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H04 (ELECTRIC COMMUNICATION TECHNIQUE) is specialized in the combination G01 and H04. We found, that Müller Hoffmann & Partner, Gill Jennings & Every LLP, Kilburn & Strode LLP, Vereenigde Octrooibureaux NV (V.O.), KOPPEL patendibüroo OÜ and 49 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 03.12.2014 - Publication A1 (EP2809018)

IPC Classification