Method of selecting a region of interest from interferometric measurements
- Application ID: EP13196937
- Status: █ APPLICATION DEEMED TO BE WITHDRAWN
This patent has the IPC combination G01 (MEASURING; TESTING) and G03 (PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY) is specialized in the combination G01 and G03. We found, that KOPPEL patendibüroo OÜ, Plougmann & Vingtoft A/S, Bird Goën & Co NV, Bonsmann Bonsmann Frank, Raffay & Fleck and 8 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.