Circuit and method for detection of IC connection failure
- Application ID: EP13189631
- Status: █ The patent has been granted
This EP application has the IPC class G01 (MEASURING; TESTING). NXP Semiconductors UK Ltd is specialized in G01. NXP B.V., NXP Semiconductors UK Ltd, NXP Semiconductors UK Ltd is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.