Adjusting sample holder orientation for symmetric incident beam and scattered beam geometry to compensate for refraction index related distortions
- Application ID: EP13187777
- Status: █ EXAMINATION IN PROGRESS
This patent has the IPC class G01 (MEASURING; TESTING) Dilg Haeusler Schindelmann Patentanwaltsgesellschaft mbH (DHS) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.