Method of performing tomographic imaging of a sample in a charged-particle microscope
- Application ID: EP13183631
- Status: █ PATENT GRANTED
This EP application has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS). FEI Company is specialized in the combination G01 and H01. We found, that TransMIT GmbH, Kailuweit & Uhlemann, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 120 others are specialized in all of these IPC classes as well. For a similar patent, they might be a good choice.