Method of performing tomographic imaging of a sample in a charged-particle microscope
- Application ID: EP13183631
- Status: █ PATENT GRANTED
This EP application has the IPC class G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS). We found, that Coller IP Management Ltd, TransMIT GmbH, Kailuweit & Uhlemann, Müller Hoffmann & Partner, Patentanwälte Rauschenbach and 117 others are specialized in this combination either. For a similar patent, they might be a good choice.