Priority Date: 12.09.12 (EP 20120184099)

Method of performing tomographic imaging of a sample in a charged-particle microscope

  • Application ID: EP13183631
  • Status: PATENT GRANTED

Applicant

Technology company logo small
Technology Company

Attorney

no operation time available
1 office
Technology Company

Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 117 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 12.09.2012 - Priority Date (EP 20120184099)
  • 19.03.2014 - Publication A1 (EP2708875)
  • 24.08.2016 - Publication B1 (EP2708875)

IPC Classification