Method for electron tomography
- Application ID: EP13170871
- Status: █ PATENT GRANTED
This EP application has the IPC class G01 (MEASURING; TESTING). FEI Company is specialized in G01. FEI Company is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.
- 10.12.2014 - Publication A1 (EP2811288)
- 10.08.2016 - Publication B1 (EP2811288)