Method for imaging a sample in a dual-beam charged particle apparatus
- Application ID: EP13170553
- Status: █ NO OPPOSITION FILED WITHIN TIMELIMIT
This EP application has the IPC class H01 (BASIC ELECTRIC ELEMENTS). FEI Company is specialized in H01. FEI Company is specialised in H01 (BASIC ELECTRIC ELEMENTS). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.
- 10.12.2014 - Publication A1 (EP2811506)
- 06.04.2016 - Publication B1 (EP2811506)