Testing circuit, wafer, measuring apparatus, device manufacturing method and display device

  • Application ID: EP13170404
  • Status: APPLICATION DEEMED TO BE WITHDRAWN

Attorney

Employment test 11 - 50 employees
Company dna pfennig meinig and partner
operating since 1878
Headquarter in Berlin and 2 offices
active in Legal Services and IP Consulting

Specialization

This EP application has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS). We found, that TransMIT GmbH, Kailuweit & Uhlemann, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 121 others are specialized in this combination either. For a similar patent, they might be a good choice.

Timeline

  • 06.11.2013 - Publication A2 (EP2660867)
  • 12.02.2014 - Publication A3 (EP2660867)