Sensor system and method for characterizing a multi-layered semiconductor material

  • Application ID: EP13170240
  • Status: APPLICATION DEEMED TO BE WITHDRAWN

Applicant

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Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 10.12.2014 - Publication A1 (EP2811285)

IPC Classification